-
1
-
-
1542333619
-
Harsh military environments and microelectromechanical (MEMS) devices
-
T. G. Brown, "Harsh military environments and microelectromechanical (MEMS) devices," in Proc. IEEE Sens., 2003, pp. 753-760.
-
(2003)
Proc. IEEE Sens
, pp. 753-760
-
-
Brown, T.G.1
-
2
-
-
0035457041
-
Mechanical reliability of MEMS-structures under shock load
-
Sep
-
U. Wagner, J. Franz, M. Schweiker, W. Bernhard, R. Muller-Fiedler, B. Michel, and O. Paul, "Mechanical reliability of MEMS-structures under shock load," Microelectron. Reliab., vol. 41, no. 9, pp. 1657-1662, Sep. 2001.
-
(2001)
Microelectron. Reliab
, vol.41
, Issue.9
, pp. 1657-1662
-
-
Wagner, U.1
Franz, J.2
Schweiker, M.3
Bernhard, W.4
Muller-Fiedler, R.5
Michel, B.6
Paul, O.7
-
3
-
-
0030364402
-
Stiction in surface micromachining
-
Dec
-
N. Tas, T. Sonnenberg, H. Jansen, R. Legtenberg, and M. Elwenspoek, "Stiction in surface micromachining," J. Micromech. Microeng., vol. 6, no. 4, pp. 385-397, Dec. 1996.
-
(1996)
J. Micromech. Microeng
, vol.6
, Issue.4
, pp. 385-397
-
-
Tas, N.1
Sonnenberg, T.2
Jansen, H.3
Legtenberg, R.4
Elwenspoek, M.5
-
4
-
-
0033743234
-
MEMS reliability in shock environments
-
D. M. Tanner, J. A. Walraven, K. Helgesen, L. W. Irwin, N. F. Smith, and N. Masters, "MEMS reliability in shock environments," in Proc. IEEE Int. Reliab. Phys. Symp., 2000, pp. 129-138.
-
(2000)
Proc. IEEE Int. Reliab. Phys. Symp
, pp. 129-138
-
-
Tanner, D.M.1
Walraven, J.A.2
Helgesen, K.3
Irwin, L.W.4
Smith, N.F.5
Masters, N.6
-
5
-
-
21644466535
-
Modeling of MEMS reliability in shock environments
-
Beijing, China
-
X.W. Fang, Q. A. Huang, and J. Y. Tang, "Modeling of MEMS reliability in shock environments," in Proc. 7th Int. Conf. Solid-State and Integr. Circuits Technol., Beijing, China, 2004, pp. 860-863.
-
(2004)
Proc. 7th Int. Conf. Solid-State and Integr. Circuits Technol
, pp. 860-863
-
-
Fang, X.W.1
Huang, Q.A.2
Tang, J.Y.3
-
6
-
-
6444245861
-
Reliability of packaged MEMS in shock environments: Crack and stiction modeling
-
Cannes, France
-
O. Millet, D. Collard, and L. Buchaillot, "Reliability of packaged MEMS in shock environments: Crack and stiction modeling," in Proc. Des. Test, Integr. and Packag. MEMS/MOEMS, Cannes, France, 2002, pp. 696-703.
-
(2002)
Proc. Des. Test, Integr. and Packag. MEMS/MOEMS
, pp. 696-703
-
-
Millet, O.1
Collard, D.2
Buchaillot, L.3
-
7
-
-
0002993948
-
Evaluation of MEMS capacitive accelerometers
-
Oct.-Dec
-
A. Béliveau, G. T. Spencer, K. A. Thomas, and S. L. Roberson, "Evaluation of MEMS capacitive accelerometers," IEEE Des. Test Comput., vol. 16, no. 4, pp. 48-56, Oct.-Dec. 1999.
-
(1999)
IEEE Des. Test Comput
, vol.16
, Issue.4
, pp. 48-56
-
-
Béliveau, A.1
Spencer, G.T.2
Thomas, K.A.3
Roberson, S.L.4
-
8
-
-
0032305564
-
Dynamic high-g loading of MEMS sensors: Ground and flight testing
-
Sep
-
T. G. Brown and B. S. Davis, "Dynamic high-g loading of MEMS sensors: Ground and flight testing," Proc. SPIE - Int. Soc. Opt. Eng., vol. 3512, pp. 228-235, Sep. 1998.
-
(1998)
Proc. SPIE - Int. Soc. Opt. Eng
, vol.3512
, pp. 228-235
-
-
Brown, T.G.1
Davis, B.S.2
-
9
-
-
0035035804
-
Strap-down microelectromechanical (MEMS) sensors for high-g munition applications
-
Jan
-
T. G. Brown, B. Davis, D. Hepner, J. Faust, C. Myers, C. Muller, T. Harkins, M. Hollis, C. Miller, and B. Placzankis, "Strap-down microelectromechanical (MEMS) sensors for high-g munition applications," IEEE Trans. Magn., vol. 37, no. 1, pp. 336-342, Jan. 2001.
-
(2001)
IEEE Trans. Magn
, vol.37
, Issue.1
, pp. 336-342
-
-
Brown, T.G.1
Davis, B.2
Hepner, D.3
Faust, J.4
Myers, C.5
Muller, C.6
Harkins, T.7
Hollis, M.8
Miller, C.9
Placzankis, B.10
-
10
-
-
0034250366
-
Drop test and analysis on micro-machined structures
-
G. X. Li and J. R. Shemansky, "Drop test and analysis on micro-machined structures," Sens. Actuators A, Phys., vol. 85, no. 1-3, pp. 280-286, 2000.
-
(2000)
Sens. Actuators A, Phys
, vol.85
, Issue.1-3
, pp. 280-286
-
-
Li, G.X.1
Shemansky, J.R.2
-
11
-
-
0030378761
-
Microstructures designed for shock robustness
-
Sep
-
S. Cunningham, D. McIntyre, J. Carper, P. Jaramillo, and W. C. Tang, "Microstructures designed for shock robustness," Proc. SPIE - Int. Soc. Opt. Eng., vol. 2880, pp. 99-107, Sep. 1996.
-
(1996)
Proc. SPIE - Int. Soc. Opt. Eng
, vol.2880
, pp. 99-107
-
-
Cunningham, S.1
McIntyre, D.2
Carper, J.3
Jaramillo, P.4
Tang, W.C.5
-
12
-
-
84964502012
-
-
B. B. Lim, J. P. Yang, S. X. Chen, J. Q.Mou, and Y. Lu, Shock analysis of MEMS actuator integrated with HGA for operational and non-operational HDD, in Proc. Asia-Pac. Magn. Conf., 2002, pp. WE-P-18-01-WE-P-18-02.
-
B. B. Lim, J. P. Yang, S. X. Chen, J. Q.Mou, and Y. Lu, "Shock analysis of MEMS actuator integrated with HGA for operational and non-operational HDD," in Proc. Asia-Pac. Magn. Conf., 2002, pp. WE-P-18-01-WE-P-18-02.
-
-
-
-
13
-
-
0037445348
-
Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers
-
Mar
-
A. R. Atwell, R. S. Okojie, K. T. Kornegay, S. L. Roberson, and A. Beliveau, "Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers," Sens. Actuators A, Phys., vol. 104, no. 1, pp. 11-18, Mar. 2003.
-
(2003)
Sens. Actuators A, Phys
, vol.104
, Issue.1
, pp. 11-18
-
-
Atwell, A.R.1
Okojie, R.S.2
Kornegay, K.T.3
Roberson, S.L.4
Beliveau, A.5
-
14
-
-
33750580935
-
Simulation on the encapsulation effect of the high-g shock MEMS accelerometer
-
Shanghai, China
-
Y. Jiang, M. Du, W. Huang, W. Xu, and L. Luo, "Simulation on the encapsulation effect of the high-g shock MEMS accelerometer," in Proc. 5th Int. Conf. Electron. Packag. Technol., Shanghai, China, 2003, pp. 52-55.
-
(2003)
Proc. 5th Int. Conf. Electron. Packag. Technol
, pp. 52-55
-
-
Jiang, Y.1
Du, M.2
Huang, W.3
Xu, W.4
Luo, L.5
-
15
-
-
34547736131
-
-
M. S. Fan and H. C. Shaw, Dynamic response assessment for the MEMS accelerometer under severe shock loads, Nat. Aeronautics and Space Admin. NASA, Washington, DC, 2001. DC TP - 2001-209978.
-
M. S. Fan and H. C. Shaw, "Dynamic response assessment for the MEMS accelerometer under severe shock loads," Nat. Aeronautics and Space Admin. NASA, Washington, DC, 2001. DC TP - 2001-209978.
-
-
-
-
16
-
-
0036601266
-
The reliability of microelectromechanical systems (MEMS) in shock environments
-
Jun
-
V. T. Srikar and S. D. Senturia, "The reliability of microelectromechanical systems (MEMS) in shock environments," J. Microelectromech. Syst., vol. 11, no. 3, pp. 206-214, Jun. 2002.
-
(2002)
J. Microelectromech. Syst
, vol.11
, Issue.3
, pp. 206-214
-
-
Srikar, V.T.1
Senturia, S.D.2
-
17
-
-
4544314725
-
The influence of mechanical shock on the operation of electrostatically driven RF-MEMS switches
-
Sep
-
J. D. Coster, H. C. Tilmans, J. T. M. van Beek, T. G. S. M. Rijks, and R. Puers, "The influence of mechanical shock on the operation of electrostatically driven RF-MEMS switches," J. Micromech. Microeng. vol. 14, no. 9, pp. S49-S54, Sep. 2004.
-
(2004)
J. Micromech. Microeng
, vol.14
, Issue.9
-
-
Coster, J.D.1
Tilmans, H.C.2
van Beek, J.T.M.3
Rijks, T.G.S.M.4
Puers, R.5
-
18
-
-
23244434818
-
Mechanical simulation for the robust design of RF-MEMS switches
-
Anaheim, CA, CD-ROM, Paper IMECE2004-60112
-
Z. Qian, J. Tomase, and K. Lian, "Mechanical simulation for the robust design of RF-MEMS switches," in Proc. ASME Int. Conf.Mech. Eng. Congr. Expo. (MEMS), Anaheim, CA, 2004, CD-ROM, Paper IMECE2004-60112.
-
(2004)
Proc. ASME Int. Conf.Mech. Eng. Congr. Expo. (MEMS)
-
-
Qian, Z.1
Tomase, J.2
Lian, K.3
-
19
-
-
0037438782
-
Shock resistance of ferromagnetic micromechanical magnetometers
-
Jan
-
J. K. Yee, H. H. Yang, and J.W. Judy, "Shock resistance of ferromagnetic micromechanical magnetometers," Sens. Actuators A, Phys., vol. 103, no. 1/2, pp. 242-252, Jan. 2003.
-
(2003)
Sens. Actuators A, Phys
, vol.103
, Issue.1-2
, pp. 242-252
-
-
Yee, J.K.1
Yang, H.H.2
Judy, J.W.3
-
21
-
-
0242636509
-
A reduced-order model for electrically actuated microbeam-based MEMS
-
Oct
-
M. I. Younis, E. M. Abdel-Rahman, and A. H. Nayfeh, "A reduced-order model for electrically actuated microbeam-based MEMS," J. Microelectromech. Syst., vol. 12, no. 5, pp. 672-680, Oct. 2003.
-
(2003)
J. Microelectromech. Syst
, vol.12
, Issue.5
, pp. 672-680
-
-
Younis, M.I.1
Abdel-Rahman, E.M.2
Nayfeh, A.H.3
-
22
-
-
21844478095
-
Reduced-order models for MEMS applications
-
Aug
-
A. H. Nayfeh, M. I. Younis, and E. M. Abdel-Rahman, "Reduced-order models for MEMS applications," Nonlinear Dyn., vol. 41, no. 1-3, pp. 211-236, Aug. 2005.
-
(2005)
Nonlinear Dyn
, vol.41
, Issue.1-3
, pp. 211-236
-
-
Nayfeh, A.H.1
Younis, M.I.2
Abdel-Rahman, E.M.3
-
23
-
-
0041369676
-
Could shock tests adequately mimic drop test conditions?
-
Sep
-
E. Suhir, "Could shock tests adequately mimic drop test conditions?" Trans. ASME, J. Electron. Packag., vol. 124, no. 3, pp. 170-177, Sep. 2002.
-
(2002)
Trans. ASME, J. Electron. Packag
, vol.124
, Issue.3
, pp. 170-177
-
-
Suhir, E.1
-
25
-
-
1342305029
-
A new approach to the modeling and simulation of flexible microstructures under the effect of squeeze- film damping
-
Feb
-
A. H. Nayfeh and M. I. Younis, "A new approach to the modeling and simulation of flexible microstructures under the effect of squeeze- film damping," J. Micromech. Microeng., vol. 14, no. 2, pp. 170-181, Feb. 2004.
-
(2004)
J. Micromech. Microeng
, vol.14
, Issue.2
, pp. 170-181
-
-
Nayfeh, A.H.1
Younis, M.I.2
-
27
-
-
0034270748
-
Effect of support compliance and residual stress on the shape of doubly supported surfacemicromachined beams
-
Sep
-
M. J. Kobrinsky, E. R. Deutsch, and S. D. Senturia, "Effect of support compliance and residual stress on the shape of doubly supported surfacemicromachined beams," J. Microelectromech. Syst., vol. 9, no. 3, pp. 361-369, Sep. 2000.
-
(2000)
J. Microelectromech. Syst
, vol.9
, Issue.3
, pp. 361-369
-
-
Kobrinsky, M.J.1
Deutsch, E.R.2
Senturia, S.D.3
-
30
-
-
17044422111
-
High-power optical microswitch based on direct fiber actuation
-
Apr
-
K. R. Cochran, L. Fan, and D. L. DeVoe, "High-power optical microswitch based on direct fiber actuation," Sens. Actuators A, Phys., vol. 119, no. 2, pp. 512-519, Apr. 2005.
-
(2005)
Sens. Actuators A, Phys
, vol.119
, Issue.2
, pp. 512-519
-
-
Cochran, K.R.1
Fan, L.2
DeVoe, D.L.3
-
32
-
-
0036851112
-
Characterization of the mechanical behavior of an electrically actuated microbeam
-
Nov
-
E. M. Abdel-Rahman, M. I. Younis, and A. H. Nayfeh, "Characterization of the mechanical behavior of an electrically actuated microbeam," J. Micromech. Microeng., vol. 12, no. 6, pp. 759-766, Nov. 2002.
-
(2002)
J. Micromech. Microeng
, vol.12
, Issue.6
, pp. 759-766
-
-
Abdel-Rahman, E.M.1
Younis, M.I.2
Nayfeh, A.H.3
-
33
-
-
33645023647
-
Response of MEMS devices under shock loads
-
Orlando, FL, CD-ROM, Paper IMECE2005-81217
-
M. I. Younis and R. Miles, "Response of MEMS devices under shock loads," in Proc. ASME IMECE, Orlando, FL, 2005, CD-ROM, Paper IMECE2005-81217.
-
(2005)
Proc. ASME IMECE
-
-
Younis, M.I.1
Miles, R.2
-
34
-
-
33750585743
-
Investigation of the response of microstructures under the combined effect of mechanical shock and electrostatic forces
-
Nov
-
M. I. Younis, R. Miles, and D. Jordy, "Investigation of the response of microstructures under the combined effect of mechanical shock and electrostatic forces," J. Micromech. Microeng., vol. 16, no. 11, pp. 2463-2474, Nov. 2006.
-
(2006)
J. Micromech. Microeng
, vol.16
, Issue.11
, pp. 2463-2474
-
-
Younis, M.I.1
Miles, R.2
Jordy, D.3
|