MEMS reliability in shock environments

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 129-138

  Tanner, Danelle M ^a   Walraven, Jeremy A ^a   Helgesen, Karen ^a   Irwin, Lloyd W ^a   Brown, Fredrick ^a   Smith, Norman F ^a   Masters, Nathan ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; CLAMPING DEVICES; ENGINES; FAILURE ANALYSIS; GEARS; RELIABILITY; SHOCK TESTING; SPRINGS (COMPONENTS); STICTION;

MICROENGINES;

MICROELECTROMECHANICAL DEVICES;

EID: 0033743234     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)