Drop test and analysis on micro-machined structures

Sensors and Actuators, A: Physical

Volumn 85, Issue 1, 2000, Pages 280-286

  Li, G X ^a   Shemansky Jr , F A ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); IMPACT TESTING; MICROACTUATORS; MICROELECTROMECHANICAL DEVICES; MICROSENSORS; ORDINARY DIFFERENTIAL EQUATIONS; OSCILLATORS (ELECTRONIC); PARTIAL DIFFERENTIAL EQUATIONS; RIGIDITY; SPRINGS (COMPONENTS);

DROP TESTS; MECHANICAL SHOCKS;

ACCELEROMETERS;

EID: 0034250366     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(00)00427-1     Document Type: Article

References (4)

1. Shemansky F.A., Ristic Lj., Koury D., Joseph E. A two-chip accelerometer system for automotive applications. Microsys. Technol. 1(3):1995;121.
2. Meirovitch L. Elements of Vibration Analysis. 1975;McGraw-Hill, New York.
3. Li G., Koury D., Courtney G., Shemansky F. Modeling and experimental observation of drop testing of micro-machined structures. Proceeding of EuroSensor XIII, The Hague, Netherlands. 1999;411.
4. Potter M.C., Goldberg J. Mathematical Methods. 1987;Printice-Hall, Englewood Cliffs, NJ.