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Volumn 14, Issue 9, 2004, Pages

The influence of mechanical shock on the operation of electrostatically driven RF-MEMS switches

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DAMPING; DIFFERENTIAL EQUATIONS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; HARMONIC ANALYSIS; INSERTION LOSSES; PARAMETER ESTIMATION; PERMITTIVITY; SENSITIVITY ANALYSIS; STIFFNESS;

EID: 4544314725     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/14/9/008     Document Type: Conference Paper
Times cited : (41)

References (15)
  • 1
    • 0035680070 scopus 로고    scopus 로고
    • RF MEMS switches and switch circuits
    • Rebeiz G and Muldavin J B 2001 RF MEMS switches and switch circuits IEEE Microw. Mag. 2 59-71
    • (2001) IEEE Microw. Mag. , vol.2 , pp. 59-71
    • Rebeiz, G.1    Muldavin, J.B.2
  • 2
    • 0038374162 scopus 로고    scopus 로고
    • MEMS for wireless communications: 'From RF-MEMS components to RF-MEMS-SiP'
    • Tilmans H A C, De Raedt W and Beyne E 2003 MEMS for wireless communications: 'from RF-MEMS components to RF-MEMS-SiP' J. Micromech. Microeng. 13 S139-63
    • (2003) J. Micromech. Microeng. , vol.13
    • Tilmans, H.A.C.1    De Raedt, W.2    Beyne, E.3
  • 5
    • 2342654536 scopus 로고    scopus 로고
    • Simulation and measurement of dielectric charging in electrostatically actuated capacitive microwave switches
    • Reid J R 2002 Simulation and measurement of dielectric charging in electrostatically actuated capacitive microwave switches MSM (San Juan, 22-25 April 2002) pp 250-3
    • (2002) MSM (San Juan, 22-25 April 2002) , pp. 250-253
    • Reid, J.R.1
  • 7
    • 0242468690 scopus 로고    scopus 로고
    • Modified Reynolds' equation and analytical analysis of squeeze-film air damping of perforated structures
    • Bao M, Yang H, Sun Y and French P 2003 Modified Reynolds' equation and analytical analysis of squeeze-film air damping of perforated structures J. Micromech. Microeng. 13 795-800
    • (2003) J. Micromech. Microeng. , vol.13 , pp. 795-800
    • Bao, M.1    Yang, H.2    Sun, Y.3    French, P.4
  • 9
    • 0036601266 scopus 로고    scopus 로고
    • The reliability of microelectromechanical systems (MEMS) in shock environments
    • Srikar V T and Senturia S D 2002 The reliability of microelectromechanical systems (MEMS) in shock environments J. Microelectromech. Syst. 11 206-14
    • (2002) J. Microelectromech. Syst. , vol.11 , pp. 206-214
    • Srikar, V.T.1    Senturia, S.D.2
  • 13
    • 4544376314 scopus 로고    scopus 로고
    • MIL-STD-883, method 2002, Cond. A
    • MIL-STD-883, method 2002, Cond. A


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.