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Volumn 52, Issue 3, 2006, Pages 854-862

Positive and negative AC impedance feedback observed above conductive substrates under SECM conditions

Author keywords

AC SECM; Approach impedance; Constant phase element; Frequency dispersion of double layer capacitance; Scanning electrochemical microscopy

Indexed keywords

AC-SECM; APPROACH IMPEDANCE; CONSTANT PHASE ELEMENT; FREQUENCY DISPERSION OF DOUBLE-LAYER CAPACITANCE;

EID: 33749519361     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.06.020     Document Type: Article
Times cited : (37)

References (20)
  • 1
    • 0003853137 scopus 로고    scopus 로고
    • Bard A.J., and Mirkin M.V. (Eds), Marcel Dekker, New York
    • In: Bard A.J., and Mirkin M.V. (Eds). Scanning Electrochemical Microscopy (2001), Marcel Dekker, New York
    • (2001) Scanning Electrochemical Microscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.