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Volumn 74, Issue 12, 1999, Pages 1752-1754

Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY; SEMICONDUCTING SILICON COMPOUNDS; SILICA; THERMAL EFFECTS; ULTRATHIN FILMS;

EID: 0032614265     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123677     Document Type: Article
Times cited : (113)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.