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Volumn 74, Issue 12, 1999, Pages 1752-1754
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Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films
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Author keywords
[No Author keywords available]
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Indexed keywords
PROBABILITY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICA;
THERMAL EFFECTS;
ULTRATHIN FILMS;
NON-ARRHENIUS TEMPERATURE DEPENDENCE;
SEMICONDUCTING FILMS;
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EID: 0032614265
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.123677 Document Type: Article |
Times cited : (113)
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References (10)
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