Effect of pMOST Bias-Temperature Instability on Circuit Reliability Performance

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2003, Pages 353-356

  Lee, Yung Huei ^a   Mielke, Neal ^a   Sabi, Babak ^a   Stadler, Stefan ^a   Nachman, Ramez ^a   Hu, Sam ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT-PATH FREQUENCIES; TEMPERATURE INSTABILITY;

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRIC FIELD EFFECTS; FAILURE (MECHANICAL); FLUORINE; FREQUENCIES; STRESS ANALYSIS; THERMAL EFFECTS; TRANSIENTS; VOLTAGE MEASUREMENT;

MOSFET DEVICES;

EID: 0842288185     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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