Brother silicon, sister germanium

Journal of the Electrochemical Society

Volumn 154, Issue 7, 2007, Pages

  Vanhellemont, J ^a   Simoen, E ^b,c  

^a GHENT UNIVERSITY   (Belgium)

^b IMEC   (Belgium)

^c ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DIFFUSION; LEAKAGE CURRENTS; MELTING POINT; SEMICONDUCTING SILICON;

CRYSTAL PULLING; DIODE LEAKAGE CURRENT; METAL CONTAMINATION;

SEMICONDUCTING GERMANIUM;

EID: 34249937561     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2732221     Document Type: Article

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