On the impact of the capture rates on the generation/recombination lifetime ratio of a single deep level

IEEE Transactions on Electron Devices

Volumn 46, Issue 7, 1999, Pages 1487-1488

  Simoen, Eddy ^a   Claeys, Cor ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE RATE RATIO;

ELECTRON TRAPS; IMPURITIES;

CHARGE CARRIERS;

EID: 0032633882     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.772495     Document Type: Article

References (11)

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