Metals in germanium

Materials Science in Semiconductor Processing

Volumn 9, Issue 4-5 SPEC. ISS., 2006, Pages 546-553

  Clauws, P ^a   Simoen, E ^b  

^a GHENT UNIVERSITY   (Belgium)

^b IMEC   (Belgium)

Author keywords

Electronic levels; Germanium; Metal impurities

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRON TRAPS; ENERGY GAP; HALL EFFECT;

BANDGAP; CARRIER LIFETIME; ELECTRONIC LEVELS; METAL DIFFUSION;

GERMANIUM;

EID: 33845189382     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.08.047     Document Type: Article

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