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Volumn 366, Issue 4-5, 2007, Pages 474-479

Fabrication and characterization of the performance of multi-channel carbon-nanotube field-effect transistors

Author keywords

Atomic force microscopy (AFM) manipulation; Electric field assisted alignment; Multi channel carbon nanotube field effect transistors (CNTFET); Single wall carbon nanotubes (SWCNTs)

Indexed keywords

ELECTRIC FIELD EFFECTS; FABRICATION; NANOSENSORS; NANOTUBES; SINGLE-WALLED CARBON NANOTUBES (SWCN); TRANSCONDUCTANCE;

EID: 34249091338     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2007.02.089     Document Type: Article
Times cited : (22)

References (37)
  • 21
    • 0842266535 scopus 로고    scopus 로고
    • A. Javey, Q. Wang, W. Kim, H. Dai, IEEE Int. Electron. Dev. Meeting Digest, 2003, p. 741
  • 30
    • 0035718181 scopus 로고    scopus 로고
    • R. Martel, H.P. Wong, K. Chan, P. Avouris, IEEE Int. Electron. Dev. Meeting Digest, 2001, p. 159


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.