-
2
-
-
0003899569
-
-
(2000)
IEDM Tech. Dig.
, pp. 45
-
-
Chau, R.1
Kavalieros, J.2
Roberds, B.3
Schenker, R.4
Lionberger, D.5
Barlage, D.6
Doyle, B.7
Arghavani, R.8
Murthy, A.9
Dewey, G.10
-
3
-
-
0034454556
-
-
(2000)
IEDM Tech. Dig.
, pp. 49
-
-
Wakabayashi, H.1
Ueki, M.2
Narihiro, M.3
Fukai, T.4
Ikezawa, N.5
Matsuda, T.6
Yoshida, K.7
Takeuchi, K.8
Ochiai, Y.9
Mogami, T.10
Kunio, T.11
-
4
-
-
0036477452
-
-
(2002)
IEEE Electron Dev. Lett.
, vol.23
, pp. 100
-
-
Appenzeller, J.1
Martel, R.2
Avouris, P.3
Knoch, J.4
Scholvin, J.5
Alamo, J.A.6
Rice, P.7
Solomon, P.8
-
8
-
-
6444244907
-
-
(1996)
Science
, vol.273
, pp. 483
-
-
Thess, A.1
Lee, R.2
Nikolaev, P.3
Dai, H.4
Petit, P.5
Robert, J.6
Xu, C.7
Lee, Y.H.8
Kim, S.G.9
Rinzler, A.G.10
Colbert, D.T.11
Scuseria, G.E.12
Tomanek, D.13
Fischer, J.E.14
Smalley, R.E.15
-
18
-
-
18344401509
-
-
(2001)
IEDM Tech. Dig.
, pp. 621
-
-
Chau, R.1
Kavalieros, J.2
Doyle, B.3
Murthy, A.4
Paulsen, N.5
Lionberger, D.6
Barlage, D.7
Arghavani, R.8
Roberds, B.9
Doczy, M.10
|