SCOPUS 정보 검색 플랫폼

Materials Science Forum

Volumn 378-381, Issue I, 2001, Pages 142-147

Calculation of diffraction line profiles for structures with dislocations

(2) Kamminga, J D a Delhez, R a

a NETHERLANDS INSTITUTE FOR METALS RESEARCH (Netherlands)

Author keywords

Diffraction; Diffraction line broadening; Dislocations

Indexed keywords

CALCULATIONS; CRYSTAL STRUCTURE; DIFFRACTION; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS;

DIFFRACTION LINE BROADENING; WILKENS MODEL;

MATERIALS SCIENCE;

EID: 0035177560 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.378-381.142 Document Type: Conference Paper

Times cited : (7)

References (9)

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- Kamminga, J.-D.¹ Delhez, R.²

2
- 0014577684
- (1969) Acta Met. , vol.17 , pp. 1155-1159
- Wilkens, M.¹

3
- 0003472812
- Reading Massachusetts: Addison-Wesley
- (1969) X-Ray Diffraction
- Warren, B.E.¹

4
- 0000041764
- edited by Simmons, J.A., de Wit, R. & Bullough, R.; Natl Bur. Stand. (US) Spec. Publ. No. 317
- (1970) Fundamental Aspects of Dislocation Theory , vol.2
- Wilkens, M.¹

5
- 0003577846
- Oxford: Clarendon Press
- (1967) Theory of Crystal Dislocations
- Nabarro, F.R.N.¹

6
- 0014803629
- (1970) Phys. Status Solidi A , vol.2 , pp. 359-370
- Wilkens, M.¹

7
- 0035879856
- (2001) Mat. Sci. Eng. A , vol.309-310 , pp. 55-59
- Kamminga, J.-D.¹ Delhez, R.²

8
- 0006687389
- to be published
- Kamminga, J.-D.¹ Delhez, R.²

9
- 2342633670
- (1995) J. Appl. Phys. , vol.77 , pp. 5026-5049
- Vermeulen, A.C.¹ Delhez, R.² De Keijser, T.H.³ Mittemeijer, E.J.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.