Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1122-1127

  Kamminga, J D ^a   Delhez, R ^a  

^a Laboratory of Materials Science   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; CALCULATION; COMPUTER SIMULATION; CRYSTALLOGRAPHY; DERIVATIZATION; DIFFRACTION; DISLOCATION; INTERMETHOD COMPARISON; SYSTEM ANALYSIS; TECHNIQUE;

EID: 0034474942     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800006750     Document Type: Article

References (8)

1. Berkum, J. G. M. van, Delhez, R., Keijser, Th. H. de & Mittemeijer, E. J. (1992). Phys. Status Solidi A, 134, 335-350.
2. Groma, I., Ungár, T. & Wilkens, M. (1988). J. Appl. Cryst. 21, 47-53.
3. Nabarro, F. R. N. (1967). Theory of Crystal Dislocations. Oxford: Clarendon Press.
4. Ungár, T., Groma, I. & Wilkens, M. (1989). J. Appl. Cryst. 22, 26-34.
5. Warren, B. E. (1969). X-ray Diffraction. Reading, Massachusetts: Addison-Wesley.
6. Wilkens, M. (1969). Acta Metall. 17, 1155-1159.
7. Wilkens, M. (1970a). Fundamental Aspects of Dislocation Theory, Vol. II, edited by J. A. Simmons, R. de Wit & R. Bullough, Natl Bur. Stand. (US) Spec. Publ. No. 317, pp. 1191-1193, 1195-1221.
8. Wilkens, M. (1970b). Phys. Status Solidi A, 2, 359-370.