Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis

Zeitschrift fur Kristallographie, Supplement

Volumn 1, Issue 23, 2006, Pages 129-134

  Schafler, E ^a,c   Nyilas, K ^b   Bernstorff, S ^d   Zeipper, L ^a,e   Zehetbauer, M ^a   Ungar T ^b  

^a UNIVERSITY OF VIENNA   (Austria)

^b EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^c ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^d SINCROTRONE TRIESTE   (Italy)

^e ARC SEIBERSDORF RESEARCH GMBH   (Austria)

Author keywords

Dislocation structure; Line profile analysis; Severe plastic deformation

Indexed keywords

EID: 33846417990     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2006.suppl_23.129     Document Type: Conference Paper

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