Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure

European Physical Journal B

Volumn 18, Issue 1, 2000, Pages 23-30

  Scardi, P ^a   Leoni, M ^a   Dong, Y H ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

61.72.Dd Experimental determination of defects by diffraction and scattering; 61.72.Lk Linear defects: dislocations, disclinations; 61.72.Nn Stacking faults and other planar or extended defects

Indexed keywords

EID: 0001316953     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510070073     Document Type: Article

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