X-ray diffraction line broadening from thermally deposited gold films

Journal of Applied Crystallography

Volumn 33, Issue 5, 2000, Pages 1271-1283

  Cheary, R W ^a   Dooryhee, E ^b   Lynch, P ^a   Armstrong, N ^c   Dligatch, S ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD;

ANISOTROPY; ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; THERMAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0034495519     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800009936     Document Type: Article

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