Bayesian inference of nanoparticle-broadened x-ray line profiles

Journal of Research of the National Institute of Standards and Technology

Volumn 109, Issue 1, 2004, Pages 155-178

  Armstrong, Nicholas ^a   Kalceff, Walter ^a   Cline, James P ^b   Bonevich, John E ^b  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Bayesian; Fuzzy pixel; Instrumental broadening; Inverse problem; Maximum entropy; Morphology; Nanoparticles; Size broadening; Size distribution; x ray line profiles

Indexed keywords

BOUNDARY CONDITIONS; CRYSTALLINE MATERIALS; DATA ACQUISITION; ENTROPY; FUNCTIONS; FUZZY CONTROL; INVERSE PROBLEMS; MICROSTRUCTURE; PARAMETER ESTIMATION; PARTICLE SIZE ANALYSIS; X RAY ANALYSIS;

BAYESIAN; FUZZY PIXEL; INSTRUMENTAL BROADENING; MAXIMUM ENTROPY; NANOPARTICLES; SIZE BROADENING; SIZE DISTRIBUTION; X-RAY LINE PROFILES;

NANOSTRUCTURED MATERIALS;

EID: 4043054262     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.109.012     Document Type: Conference Paper

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