Dynamic force microscopy with quartz tuning forks at high oscillation amplitudes

Nanotechnology

Volumn 18, Issue 8, 2007, Pages

  Labardi, M ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; OSCILLATORS (ELECTRONIC); SENSORS; SPECTROSCOPIC ANALYSIS; ULTRAHIGH VACUUM;

DYNAMIC FORCE MICROSCOPY (DFM); Q FACTORS; TUNING FORKS;

QUARTZ;

SILICON DIOXIDE;

AMPLITUDE MODULATION; CONFERENCE PAPER; DYNAMIC FORCE MICROSCOPY; MEASUREMENT; MICROSCOPY; OSCILLATION; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SENSITIVITY ANALYSIS; SPECTROSCOPY;

EID: 33947545067     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084019     Document Type: Conference Paper

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