Stability of dynamic force microscopy with the self-oscillator method

Nanotechnology

Volumn 17, Issue 12, 2006, Pages 3071-3080

  Labardi, M ^a,b  

^a UNIVERSITY OF COLORADO   (United States)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; OSCILLATIONS; RESONANCE; SPECTROSCOPIC ANALYSIS; VACUUM;

CANTILEVER OSCILLATION; DYNAMIC FORCE MICROSCOPY (DFM); FREQUENCY SHIFT; RESONANCE CURVE;

OSCILLATORS (ELECTRONIC);

EID: 33746614429     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/12/043     Document Type: Article

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