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Volumn 70, Issue 24, 2004, Pages 1-9

Conservative and dissipative forces measured by self-oscillator atomic force microscopy at constant-drive amplitude

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; ELECTRIC POTENTIAL; MATHEMATICAL ANALYSIS; MOLECULAR INTERACTION; OSCILLATION; SURFACE PROPERTY;

EID: 14944380909     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.245414     Document Type: Article
Times cited : (10)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.