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Volumn 202, Issue 1, 2001, Pages 84-93

Optical near-field harmonic demodulation in apertureless microscopy

Author keywords

Apertureless; Artefact; Demodulation; Harmonics; Microscopy; Near field; Tuning fork

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEMODULATION; HARMONIC ANALYSIS; OPTICAL SIGNAL PROCESSING; OPTICAL VARIABLES MEASUREMENT; TUNING;

EID: 84988359018     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00882.x     Document Type: Article
Times cited : (34)

References (22)
  • 3
    • 0001141830 scopus 로고    scopus 로고
    • Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscope
    • (1999) Opt. Lett. , vol.24 , pp. 1005-1007
    • Bridger, P.M.1    McGill, T.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.