Characterization of electronic materials and devices by scanning near-field microscopy

Applied Physics A: Materials Science and Processing

Volumn 87, Issue 3, 2007, Pages 443-449

  Balk, L J ^a,b   Heiderhoff, R ^a   Phang, J C H ^b   Thomas, Ch ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; WAVELENGTH;

ELECTRONIC MATERIALS; NEAR-FIELD INTERACTION MECHANISMS; STATIC FIELDS;

ELECTRONIC EQUIPMENT;

EID: 33947216534     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-3910-3     Document Type: Article

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