메뉴 건너뛰기




Volumn 37, Issue 6, 2004, Pages 952-963

Quantitative dynamic near-field microscopy of thermal conductivity

Author keywords

[No Author keywords available]

Indexed keywords

HEAT FLOW; SCANNING THERMAL MICROSCOPY (STHM);

EID: 1842476282     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/6/023     Document Type: Article
Times cited : (45)

References (40)
  • 1
    • 0000398380 scopus 로고
    • Thermische Oszillationen wechselstromdurchflossener Lampen mit dünnen Faden und daraus sich ergebender Gleichrichterwirkung infolge der Anwesenheit geradzahliger Oberschwingungen
    • Corbino O M 1910 Thermische Oszillationen wechselstromdurchflossener Lampen mit dünnen Faden und daraus sich ergebender Gleichrichterwirkung infolge der Anwesenheit geradzahliger Oberschwingungen Phys. Z. 11 413-17
    • (1910) Phys. Z , vol.11 , pp. 413-417
    • Corbino, O.M.1
  • 2
    • 32144460107 scopus 로고
    • Thermal conductivity of amorphous solids above the plateau
    • Cahill D G and Pohl R O 1987 Thermal conductivity of amorphous solids above the plateau Phys. Rev. B 35 4067-73
    • (1987) Phys. Rev. B , vol.35 , pp. 4067-4073
    • Cahill, D.G.1    Pohl, R.O.2
  • 5
    • 0035397356 scopus 로고    scopus 로고
    • 3ω method for specific heat and thermal conductivity measurements
    • Lu L, Yi W and Zhang D L 2001 3ω method for specific heat and thermal conductivity measurements Rev. Sci. Instrum. 72 2996-3003
    • (2001) Rev. Sci. Instrum. , vol.72 , pp. 2996-3003
    • Lu, L.1    Yi, W.2    Zhang, D.L.3
  • 6
    • 0029673737 scopus 로고
    • The 3ω technique for measuring dynamic specific heat and thermal conductivity of a liquid or solid
    • Moon I K, Jeong Y H and Kwun S 11995 The 3ω technique for measuring dynamic specific heat and thermal conductivity of a liquid or solid Rev. Sci. Instrum. 67 29-35
    • (1995) Rev. Sci. Instrum. , vol.67 , pp. 29-35
    • Moon, I.K.1    Jeong, Y.H.2    Kwun, S.I.3
  • 7
    • 3543071901 scopus 로고
    • Specific-heat spectroscopy of the glass transition
    • Birge N O and Nagel S R 1985 Specific-heat spectroscopy of the glass transition Phys. Rev. Lett. 54 2674-7
    • (1985) Phys. Rev. Lett. , vol.54 , pp. 2674-2677
    • Birge, N.O.1    Nagel, S.R.2
  • 8
    • 35949018243 scopus 로고
    • Specific-heat spectroscopy of glycerol and propylene glycol near the glass transition
    • Birge N O 1986 Specific-heat spectroscopy of glycerol and propylene glycol near the glass transition Phys. Rev. B 34 1631-42
    • (1986) Phys. Rev. B , vol.34 , pp. 1631-1642
    • Birge, N.O.1
  • 9
    • 0001095657 scopus 로고
    • Wide-frequency specific heat spectrometer
    • Birge N O and Nagel S R 1987 Wide-frequency specific heat spectrometer Rev. Sci. Instrum. 58 1464-70
    • (1987) Rev. Sci. Instrum. , vol.58 , pp. 1464-1470
    • Birge, N.O.1    Nagel, S.R.2
  • 10
    • 0033134045 scopus 로고    scopus 로고
    • Investigation on measurement accuracy of the periodic hot-wire method by means of numerical temperature field calculations
    • Griesinger A, Heidemann W and Hahne E 1999 Investigation on measurement accuracy of the periodic hot-wire method by means of numerical temperature field calculations Int. Commun. Heat Mass Transfer 26 451-65
    • (1999) Int. Commun. Heat Mass Transfer , vol.26 , pp. 451-465
    • Griesinger, A.1    Heidemann, W.2    Hahne, E.3
  • 12
    • 36549099049 scopus 로고
    • Thermal conductivity measurement from 30 to 750 K: The 3ω method
    • Cahill D G 1990 Thermal conductivity measurement from 30 to 750 K: the 3ω method Rev. Sci. Instrum. 61 802-8
    • (1990) Rev. Sci. Instrum , vol.61 , pp. 802-808
    • Cahill, D.G.1
  • 13
    • 1842550400 scopus 로고
    • Heat transport in micron thick a-Si: H films
    • Cahill D G, Katiyar M and Abelson J R 1995 Heat transport in micron thick a-Si: H films Phil. Mag. B 71 677-82
    • (1995) Phil. Mag. B , vol.71 , pp. 677-682
    • Cahill, D.G.1    Katiyar, M.2    Abelson, J.R.3
  • 14
  • 15
    • 0000941763 scopus 로고    scopus 로고
    • Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness
    • Kim J H, Feldman A and Novotny D 1999 Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness J. Appl. Phys. 86 3959-63
    • (1999) J. Appl. Phys. , vol.86 , pp. 3959-3963
    • Kim, J.H.1    Feldman, A.2    Novotny, D.3
  • 16
    • 0035306385 scopus 로고    scopus 로고
    • Data reduction in 3ω method for thin-film thermal conductivity determination
    • Borca-Tasciuc T, Kumar A R and Chen G 2001 Data reduction in 3ω method for thin-film thermal conductivity determination Rev. Sci. Instrum. 72 2139-47
    • (2001) Rev. Sci. Instrum. , vol.72 , pp. 2139-2147
    • Borca-Tasciuc, T.1    Kumar, A.R.2    Chen, G.3
  • 17
    • 0037636513 scopus 로고    scopus 로고
    • Extending the 3ω method for thin-film analysis to high frequencies
    • Raudzis C E, Schatz F and Waharam D 2003 Extending the 3ω method for thin-film analysis to high frequencies J. Appl. Phys. 93 6050-5
    • (2003) J. Appl. Phys. , vol.93 , pp. 6050-6055
    • Raudzis, C.E.1    Schatz, F.2    Waharam, D.3
  • 19
    • 0000832716 scopus 로고
    • Thermal conductivity contrast imaging with a scanning thermal microscope
    • Dinwiddie R B, Pylkki R J and West P E 1994 Thermal conductivity contrast imaging with a scanning thermal microscope Thermal Conductivity 22 668-77
    • (1994) Thermal Conductivity , vol.22 , pp. 668-677
    • Dinwiddie, R.B.1    Pylkki, R.J.2    West, P.E.3
  • 20
    • 0038341806 scopus 로고    scopus 로고
    • Thermal conductivity calibration for hot wire based dc scanning thermal microscopy
    • Lefevre S, Volz S, Saulnier J B, Fuentes C and Trannoy N 2002 Thermal conductivity calibration for hot wire based dc scanning thermal microscopy Rev. Sci. Instrum. 74 2418-23
    • (2002) Rev. Sci. Instrum. , vol.74 , pp. 2418-2423
    • Lefevre, S.1    Volz, S.2    Saulnier, J.B.3    Fuentes, C.4    Trannoy, N.5
  • 22
    • 1842550407 scopus 로고    scopus 로고
    • Goodfellow Group 2003 Index of materials, http://www.goodfellow.com/csp/ active/
    • (2003) Index of Materials
  • 25
    • 0032494306 scopus 로고    scopus 로고
    • 3D thermal wave scattering on burned inhomogeneities in ac thermal microscopy
    • Gomes S, Depasse F and Grossel P 1998 3D thermal wave scattering on burned inhomogeneities in ac thermal microscopy J. Phys. D: Appl. Phys. 31 377-87
    • (1998) J. Phys. D: Appl. Phys. , vol.31 , pp. 377-387
    • Gomes, S.1    Depasse, F.2    Grossel, P.3
  • 26
    • 0034165363 scopus 로고    scopus 로고
    • Ac scanning thermal microscopy: Tip-sample interaction and buried defects modellings
    • Gomes S, Trannoy N, Depasse F and Grossel P 2000 Ac scanning thermal microscopy: tip-sample interaction and buried defects modellings Int. J. Therm. Sci. 39 526-31
    • (2000) Int. J. Therm. Sci. , vol.39 , pp. 526-531
    • Gomes, S.1    Trannoy, N.2    Depasse, F.3    Grossel, P.4
  • 30
    • 0037011973 scopus 로고    scopus 로고
    • Application of a wollaston wire probe for quantitative thermal analysis
    • Buzin A I, Kamasa P, Pyda M and Wunderlich B 2001 Application of a wollaston wire probe for quantitative thermal analysis Thermochim. Acta 381 9-18
    • (2001) Thermochim. Acta , vol.381 , pp. 9-18
    • Buzin, A.I.1    Kamasa, P.2    Pyda, M.3    Wunderlich, B.4
  • 32
    • 0033893124 scopus 로고    scopus 로고
    • The principles of micro-thermal analysis and its application to the study of macromolecules
    • Moon I, Androsch R, Chen W and Wunderlich B 2000 The principles of micro-thermal analysis and its application to the study of macromolecules J. Thermal Anal. Calorimetry 59 187-203
    • (2000) J. Thermal Anal. Calorimetry , vol.59 , pp. 187-203
    • Moon, I.1    Androsch, R.2    Chen, W.3    Wunderlich, B.4
  • 33
    • 0037458076 scopus 로고    scopus 로고
    • Theoretical investigations of dc and ac heat diffusion for submicroscopies and nanoscopies
    • Depasse F, Grossel P and Gomes S 2003 Theoretical investigations of dc and ac heat diffusion for submicroscopies and nanoscopies J Phys. D: Appl. Phys. 36 204-10
    • (2003) J Phys. D: Appl. Phys. , vol.36 , pp. 204-210
    • Depasse, F.1    Grossel, P.2    Gomes, S.3
  • 34
    • 0037139065 scopus 로고    scopus 로고
    • Comparison of thermal conductivities on abraded and untreated CVD-diamond obtained by scanning thermal microscopy
    • Presented at 'International Conf. on Materials for Advanced Technologies' (ICMAT 2001) (1.-6.7.2001, Singapore)
    • Altes A, Jentsch H G, Rosiwal S M, Heiderhoff R and Balk L J 2002 Comparison of thermal conductivities on abraded and untreated CVD-diamond obtained by scanning thermal microscopy Int. J. Mod. Phys. B 16 922-6 Presented at 'International Conf. on Materials for Advanced Technologies' (ICMAT 2001) (1.-6.7.2001, Singapore)
    • (2002) Int. J. Mod. Phys. B , vol.16 , pp. 922-926
    • Altes, A.1    Jentsch, H.G.2    Rosiwal, S.M.3    Heiderhoff, R.4    Balk, L.J.5
  • 35
    • 0037139043 scopus 로고    scopus 로고
    • Complementary surface investigation of diamond by scanning thermal microscopy and scanning near-field cathodoluminescence
    • Presented at 'International Conf., on Materials for Advanced Technologies' (ICMAT 2001) (1.-6.7.2001, Singapore)
    • Altes A, Heiderhoff R and Balk L J 2002 Complementary surface investigation of diamond by scanning thermal microscopy and scanning near-field cathodoluminescence Int. J. Mod. Phys. B 16 895-9 Presented at 'International Conf., on Materials for Advanced Technologies' (ICMAT 2001) (1.-6.7.2001, Singapore)
    • (2002) Int. J. Mod. Phys. B , vol.16 , pp. 895-899
    • Altes, A.1    Heiderhoff, R.2    Balk, L.J.3
  • 38
    • 0033322020 scopus 로고    scopus 로고
    • Probing surface microthermal properties by scanning thermal microscopy
    • Gorbunov V V, Fuchigami N, Hazel J L and Tsukruk V V 1999 Probing surface microthermal properties by scanning thermal microscopy Langmuir 15 8340-3
    • (1999) Langmuir , vol.15 , pp. 8340-8343
    • Gorbunov, V.V.1    Fuchigami, N.2    Hazel, J.L.3    Tsukruk, V.V.4
  • 39
    • 0032728612 scopus 로고    scopus 로고
    • De thermal microscopie: Study of the thermal exchange between a probe and a sample
    • Gomes S, Trannoy N and Grossel P 1999 De thermal microscopie: study of the thermal exchange between a probe and a sample Meas. Sci. Technol. 10 805-11
    • (1999) Meas. Sci. Technol. , vol.10 , pp. 805-811
    • Gomes, S.1    Trannoy, N.2    Grossel, P.3
  • 40
    • 1842498064 scopus 로고    scopus 로고
    • Low temperature sintering glass-ceramic matrix composites with high thermal conductivity - Effect of matrix composition, matrix-dispersant interface and dispersant size on thermal conductivity
    • Schluckwerder H 2003 Low temperature sintering glass-ceramic matrix composites with high thermal conductivity - effect of matrix composition, matrix-dispersant interface and dispersant size on thermal conductivity Proc. Int. Thermal Conductivity Conf. (ITCC 27) (KNOXVILLE, TENESSEE, USA, 26-29 October 2003)
    • (2003) Proc. Int. Thermal Conductivity Conf. (ITCC 27) (KNOXVILLE, TENESSEE, USA, 26-29 October 2003)
    • Schluckwerder, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.