Imprint mechanism in integrated Bi-rich SrBi2Ta 2O9 capacitors: Influence of the temperature-dependent polarization

Journal of Applied Physics

Volumn 100, Issue 12, 2006, Pages

  Goux, L ^a   Wouters, D J ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; FERROELECTRIC MATERIALS; HYSTERESIS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; POLARIZATION; STRONTIUM COMPOUNDS; THERMAL EFFECTS;

BIPOLAR VOLTAGE CYCLING; FERROELECTRIC CAPACITORS; HYSTERESIS LOOPS; LANDAU-DEVONSHIRE LAW;

MOS CAPACITORS;

EID: 33846050447     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2402027     Document Type: Article

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