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Volumn 52, Issue , 2003, Pages 155-161

Imprint characteristics of Bi-layered perovskite ferroelectric thin films

Author keywords

FeRAM; Imprint; Imprint life time; Reliability; SBT: BLT

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; PEROVSKITE; POLARIZATION; RELIABILITY; THIN FILM DEVICES;

EID: 33745119716     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580390254475     Document Type: Article
Times cited : (3)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.