Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films

Applied Physics Letters

Volumn 76, Issue 3, 2000, Pages 363-365

  Grossmann, M ^a   Lohse, O ^a   Bolten, D ^a   Boettger, U ^a   Waser, R ^a   Hartner, W ^b   Kastner, M ^b   Schindler, G ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001253071     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125755     Document Type: Article

References (18)

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