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Volumn 41, Issue 11 B, 2002, Pages 6840-6843

Imprint characteristics of ferroelectric thin films at elevated storage and operation temperatures

Author keywords

BLT; FeRAM; Imprint; SBT; Thin film; Voltage shift

Indexed keywords

ELECTRIC POTENTIAL; FERROELECTRIC DEVICES; POLARIZATION; THERMAL EFFECTS;

EID: 12944332792     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.6840     Document Type: Article
Times cited : (9)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.