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Volumn 98, Issue 5, 2005, Pages

Composition control and ferroelectric properties of sidewalls in integrated three-dimensional SrBi 2Ta 2O 9 -based ferroelectric capacitors

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION CONTROL; ELECTRICAL BEHAVIORS; FERROELECTRIC CAPACITORS; SIDEWALLS;

EID: 25144505555     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2012508     Document Type: Article
Times cited : (17)

References (23)
  • 1
    • 25144443404 scopus 로고    scopus 로고
    • Technical Digest of IEDM 2003, Washington DC, p.
    • S.-H. Oh, Technical Digest of IEDM 2003, Washington DC, p. 835.
    • Oh, S.-H.1
  • 2
  • 3
    • 25144522492 scopus 로고    scopus 로고
    • Technical Digest, Proceedings of the 2003 Symposium on VLSI Technology, Kyoto, Japan, p.
    • Y. Nagano, Technical Digest, Proceedings of the 2003 Symposium on VLSI Technology, Kyoto, Japan, p. 171.
    • Nagano, Y.1
  • 4
    • 25144432145 scopus 로고    scopus 로고
    • Digest of Technical Papers, Proceedings of the 2003 Symposium of VLSI Circuits, Kyoto, Japan, p.
    • H. McAdams, Digest of Technical Papers, Proceedings of the 2003 Symposium of VLSI Circuits, Kyoto, Japan, p. 175.
    • McAdams, H.1
  • 5
    • 17444386786 scopus 로고    scopus 로고
    • 0950-5423
    • R. Zambrano, 0950-5423 53, 247 (2003).
    • (2003) , vol.53 , pp. 247
    • Zambrano, R.1
  • 8
    • 25144482146 scopus 로고    scopus 로고
    • Joint Committee Pattern Diffraction Society JCPDS Card Nos. 74-1375 and 78-1793 (unpublished).
    • Joint Committee Pattern Diffraction Society JCPDS Card Nos. 74-1375 and 78-1793 (unpublished).
  • 10
    • 25144445121 scopus 로고    scopus 로고
    • 16th International Symposium on Integrated Ferroelectric (ISIF)
    • Y. Park, 16th International Symposium on Integrated Ferroelectric (ISIF), 2004, Gyeongju, Korea, Abstract No. 1-04-C.
    • (2004)
    • Park, Y.1
  • 19
    • 13744249435 scopus 로고    scopus 로고
    • N. Menou, J. Appl. Phys. 97 (4), 44106 (2005).
    • (2005) J. Appl. Phys. , vol.97 , Issue.4 , pp. 44106
    • Menou, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.