Growth and structural investigations of epitaxial hexagonal YMnO3 thin films deposited on wurtzite GaN(001) substrates

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 1807-1813

  Balasubramanian, K R ^a   Chang, Kai Chieh ^a   Mohammad, Feroz A ^a   Porter, Lisa M ^a   Salvador, Paul A ^a   DiMaio, Jeffrey ^b   Davis, Robert F ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b North Carolina State University   (United States)

Author keywords

Epitaxy; Gallium nitride; Heterostructures; Laser ablation; Oxides; Transmission electron microscopy; X ray diffraction; Yttrium manganese oxide

Indexed keywords

EPITAXIAL GROWTH; GALLIUM NITRIDE; INTERFACES (MATERIALS); LASER ABLATION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

INTERFACIAL LAYER; LATTICE MISMATCH; SUBSTRATE TREATMENT;

THIN FILMS;

EID: 33750899690     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.07.001     Document Type: Article

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