Preparation and characterization of ferroelectric YMnO3 thin film

IEEE International Symposium on Applications of Ferroelectrics

Volumn 2, Issue , 2000, Pages 657-659

  Guo, H Y ^a   Wilson, I H ^a   Xu, J B ^a   Cheung, W Y ^a   Ke, N ^a   Sundaral, B ^a   Luo, E Z ^a   Lin, J ^a   Yu, J ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; METHANOL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SOL-GELS; SOLUTIONS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

CITRIC ACID; MANGANESE NITRATE; METHOXYETHANOL; RUTHERFORD BACKSCATTERING SPECTROMETRY; YTTRIUM NITRATE;

FERROELECTRIC THIN FILMS;

EID: 0034473727     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Characterization of frroelectricity in metal/ferroelectric/insulator/semiconductor structure
2. 3
3. 3 thin films prepared via solution
4. 3 thin films