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Volumn 100, Issue 5, 2006, Pages

Hydrogen-induced crystallization of amorphous silicon thin films. I. Simulation and analysis of film postgrowth treatment with H 2 plasmas

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE ANALYSIS; FILM SURFACE COMPOSITION; NANOCRYSTALLINE SILICON; POSTDEPOSITION TREATMENT;

EID: 33748915067     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2229426     Document Type: Article
Times cited : (40)

References (58)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.