Fracture toughness and subcritical crack growth in polycrystalline silicon

Journal of Applied Mechanics, Transactions ASME

Volumn 73, Issue 5, 2006, Pages 714-722

  Chasiotis, I ^a   Cho, S W ^b   Jonnalagadda, K ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL IMAGE CORRELATION METHOD; LOCAL CLEAVAGE ANISOTROPY; MECHANICAL RELIABILITY; STRESS INTENSITY;

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; FRACTURE TOUGHNESS; STRENGTH OF MATERIALS; STRESS ANALYSIS;

POLYSILICON;

EID: 33748437824     PISSN: 00218936     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2172268     Document Type: Conference Paper

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