Atomic resolution STEM-HAADF imaging in the study of interfaces

Archives of Metallurgy and Materials

Volumn 51, Issue 1, 2006, Pages 23-32

  Carlino, E ^a   Grillo, V ^a  

^a LABORATORIO TASC   (Italy)

Author keywords

Atomic resolution imaging; HAADF; HRTEM; Simulation; STEM; TEM

Indexed keywords

EID: 33745289068     PISSN: 08607052     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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