Kelvin force microscopy on a (Al1-xGax) 0.5in0.5P light-emitting diode

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6134, Issue , 2006, Pages

  Katzer, Klaus Dieter ^a   Mertin, Wolfgang ^a   Bacher, Gerd ^a   Jaeger, Arndt ^b   Streubel, Klaus ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

Author keywords

AlGaInP; Kelvin Force Microscopy; Light Emitting Diode

Indexed keywords

ALUMINUM COMPOUNDS; COMPUTER SIMULATION; ELECTRONIC PROPERTIES; MICROSCOPIC EXAMINATION; OPTIMIZATION; VOLTAGE CONTROL;

ALGAINP; HETEROSTRUCRURE LAYERS; KELVIN FORCE MICROSCOPY;

LIGHT EMITTING DIODES;

EID: 33646794422     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.645768     Document Type: Conference Paper

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