Investigating atomic details of the CaF2(111) surface with a qPlus sensor

Nanotechnology

Volumn 16, Issue 3, 2005, Pages

  Giessibl, Franz J ^a   Reichling, Michael ^b  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; FREQUENCY MODULATION; IONS; NEGATIVE IONS; PATTERN MATCHING; SENSORS; SURFACES; ULTRAHIGH VACUUM; VAN DER WAALS FORCES;

ALKALI HALIDES; CONTRAST PATTERNS; ELECTROSTATIC FORCES; SCANNING STABILITY;

CALCIUM COMPOUNDS;

EID: 15844371601     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/3/022     Document Type: Conference Paper

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