Tutorial review: X-ray mapping in electron-beam instruments

Microscopy and Microanalysis

Volumn 12, Issue 1, 2006, Pages 2-25

  Friel, John J ^a   Lyman, Charles E ^b  

^a Princeton Gamma Tech   (United States)

^b Lehigh University   (United States)

Author keywords

Compositional imaging; Concentration concentration histograms; EDS; Multivariate statistical analysis; Position tagged spectrometry; Principal component analysis; Spectrum imaging; WDS; X ray mapping; X ray spectrometry

Indexed keywords

ANIMAL; ARTIFACT; COMPUTER ASSISTED TOMOGRAPHY; ELECTRON; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; PAROTID GLAND; RAT; REVIEW; ULTRASTRUCTURE; X RAY;

ANIMALS; ARTIFACTS; ELECTRONS; IMAGE PROCESSING, COMPUTER-ASSISTED; PAROTID GLAND; RATS; TOMOGRAPHY, X-RAY COMPUTED; X-RAYS;

EID: 33644868365     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060211     Document Type: Review

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