Electron Probe Microanalysis of Insulating Materials: Quantification Problems and Some Possible Solutions

X-Ray Spectrometry

Volumn 25, Issue 6, 1996, Pages 265-280

  Cazaux, J ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; INSULATING MATERIALS; INTELLIGENT SYSTEMS;

ELECTRICAL NEUTRALITY; ELECTRON BOMBARDMENTS; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; ION DESORPTION; ION MIGRATION; MACROSCOPIC EFFECTS; MATERIAL QUANTIFICATION; MOBILE IONS; SIMPLE++;

MONTE CARLO METHODS;

EID: 0030509549     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199611)25:6<265::AID-XRS172>3.0.CO;2-3     Document Type: Article

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