Real-time simulation for x-ray microanalysis

Solid State Technology

Volumn 39, Issue 3, 1996, Pages

  Brundle, Dick ^a   Uritsky, Yuri ^a   Chernoff, Don ^a  

^a CR Brundle and Associates

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; MICROANALYSIS; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS;

ENERGY DISPERSIVE SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 0030109689     PISSN: 0038111X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (2)