Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers

Journal of Electron Microscopy

Volumn 47, Issue 1, 1998, Pages 39-46

  Takahashi, Hideyuki ^a   Okumura, Toyohiko ^a  

^a JEOL LTD   (Japan)

Author keywords

Convex surface; Electron probe X ray microanalyser; Elemental mapping; Fractured surface; Probe scan mode; Stage scan mode

Indexed keywords

DISPERSION (WAVES); ELECTRONS; LASER OPTICS; MAPPING; SPECTROMETERS;

AREA MAPPING; CONVEX SURFACES; ELECTRON PROBE X-RAY MICROANALYZER; ELEMENTAL MAPPING; FRACTURED SURFACES; PROBE-SCAN MODE; SCAN MODE; STAGE-SCAN MODE; WAVELENGTH DISPERSIVE SPECTROMETERS;

PROBES;

EID: 0031947217     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023557     Document Type: Article

References (12)

1. Yamada M, Kato M J (1988) Japan Inst. Metals 52: 1221-1227.
2. Taguchi I, Hamada H, and Kama M (1982) JEOL News 20E: 59.
3. Uchikawa H, Uchida S, and Hanehara S (1987) IL Cement 84: 117.
4. th International Congress on X-ray Optics and Microanalysis. Ontario, London, pp. 183-186.
5. Nakano T, Takahara H, and Nishida N (1989) Canadian Mineralogist 27: 499-507.
6. Abe Y (1986) J. Jpn Soc. Dent. Materials Devices 5: 839-851.
7. Ban S, Kitaoka T, Hisada K, Takahashi Y, and Hasegawa J (1984) J. Jpn Soc. Dental Materials Devices 3: 802-809.
8. Reed S J B (1993) Electron Microprobe Analysis second edition: p. 69, (Cambridge University Press).
9. Takahashi H (1995) 14th Inter Congress on X-ray Options and Microanalysis. Zinzao, China.
10. Notoya S, Saito M, Matsuya M, Ishii, T, Ohashi H, and Nielsen C (1996) Proceedings of Microscopy and Miocroanalysis, pp. 442-443.
11. Ono Y and Tagata S (1982) Proceedings of 18th Meeting for Applied Spectrometry at Tokyo, pp. 182-183.
12. Goldstein J I, et al. (1994) Scanning Electron Microscopy and X-ray Microanalysis, p. 531, (Plenum Press, New York).