Tomographic spectral imaging: Comprehensive 3D X-ray microanalysis

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 1004-1005

  Kotula, P G ^a   Keenan, M R ^a   Michael, J R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042421902     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603445029     Document Type: Conference Paper

References (3)

1. P.G. Kotula et al., Microsc. Microanal. 9[1] (2003) 1-17.
2. Cheng, Z. et al. J. Vac. Sci. Tech. 16 (1998) 2473.
3. Newbury, D.E., Bright, D.S. Microsc. Microanal. 5, (1999) 333-343.