"Derived spectra" software tools for detecting spatial and spectral features in spectrum images

Scanning

Volumn 27, Issue 1, 2005, Pages 15-22

  Newbury, Dale E ^a   Bright, David S ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Datacube; Derived spectrum; Microbeam analysis; Scanned probe imaging; Spectrum image; X ray mapping

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; DATABASE SYSTEMS; IMAGE PROCESSING; INFORMATION ANALYSIS; X RAY ANALYSIS;

SPATIAL FEATURES; SPECTRAL FEATURES; X-RAY PHOTON BEAMS; X-RAY PHOTON ENERGY;

FEATURE EXTRACTION;

ALGORITHM; ARTICLE; CALCULATION; COMPUTER PROGRAM; DATA BASE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; X RAY SPECTROMETRY;

CAD CAM; DATA BASES; IMAGE ANALYSIS; X RAY ANALYSIS;

EID: 14644400481     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950270104     Document Type: Article

References (6)

1. Bright DS and Newbury DE: Maximum pixel spectrum: A new tool For detecting And recovering rare, unanticipated features from spectrum image data cubes. J Microsc 216, 186-193 (2004)
2. Gorlen KE, Barden LK, Del Priore JS, Fiori CE, Gibson CC, Leapman RD: Computerized analytical electron microscope for elemental imaging. Rev Sci Instrum 55, 912-921 (1984)
3. Jeanguillaume C, Colliex C: Spectrum image: the next step in EELS digital acquisition and processing. Ultramicroscopy 28, 252-257 (1989)
4. Kotula P, Keenan MR, Michael Jr. JR: Automated analysis of SEM x-ray spectralimages: A powerful new microanalysis tool. Microsc Microanal 9, 1-17 (2003)
5. Mott RB, Friel JJ: Improving EDS performance with digital pulse processing. In X-ray Spectrometry in Electron Beam Instruments (Eds. Williams DB, Goldstein JI, Newbury DE). Plenum, New York (1995) 127-157
6. Struder L, Fiorini C, Gatti E, Hartmann R, Holl P, Krause N, Lechner P, Longoni A, Lutz G, Kemmer J, Meidinger N, Popp M, Soltau H, von Zanthier C: High resolution non-dispersive x-ray spectroscopy with state of the art silicon detectors. Mikrochim Acta 15 (1998) (suppl): S11-S19