-
1
-
-
30644467196
-
-
S. A. MacDonald, W. D. Hinsberg, H. R. Wendt, N. J. Clecak, and C. G. Willson, Chem. Mater., 5, 346 (1993).
-
(1993)
Chem. Mater.
, vol.5
, pp. 346
-
-
MacDonald, S.A.1
Hinsberg, W.D.2
Wendt, H.R.3
Clecak, N.J.4
Willson, C.G.5
-
2
-
-
33751159038
-
-
W. D. Hinsberg, S. A. MacDonald, and N. J. Clecak, Chem. Mater., 6, 481 (1994).
-
(1994)
Chem. Mater.
, vol.6
, pp. 481
-
-
Hinsberg, W.D.1
MacDonald, S.A.2
Clecak, N.J.3
-
4
-
-
0032663125
-
-
O. Kishkovich, D. A. Kinkead, J. Higley, R. Kerwin, and J. Piatt, Proc. SPIE, 1999, 348.
-
Proc. SPIE
, vol.1999
, pp. 348
-
-
Kishkovich, O.1
Kinkead, D.A.2
Higley, J.3
Kerwin, R.4
Piatt, J.5
-
5
-
-
0032562806
-
-
S. J. Lue, T. Wu, H. Hsu, and C. Huang, J. Chromatogr., A, 804, 273 (1998).
-
(1998)
J. Chromatogr., A
, vol.804
, pp. 273
-
-
Lue, S.J.1
Wu, T.2
Hsu, H.3
Huang, C.4
-
6
-
-
0032797890
-
-
S. J. Lue, T. Wu, H. Hsu, and C. Huang, J. Chromatogr., A, 850, 283 (1999).
-
(1999)
J. Chromatogr., A
, vol.850
, pp. 283
-
-
Lue, S.J.1
Wu, T.2
Hsu, H.3
Huang, C.4
-
7
-
-
4243061989
-
-
A. J. Muller, L. A. Psota-Kelty, H. W. Krautter, and J. D. Sinclair, Solid State Technol., 37, 61 (1994).
-
(1994)
Solid State Technol.
, vol.37
, pp. 61
-
-
Muller, A.J.1
Psota-Kelty, L.A.2
Krautter, H.W.3
Sinclair, J.D.4
-
8
-
-
0030244894
-
-
J. A. Lebens, W. C. McColgin, and J. B. Russell, J. Electrochem. Soc., 143, 2906 (1996).
-
(1996)
J. Electrochem. Soc.
, vol.143
, pp. 2906
-
-
Lebens, J.A.1
McColgin, W.C.2
Russell, J.B.3
-
9
-
-
30644467050
-
-
H. Bai, Y. Kang, and C. Liu, Aerosol & Air Quality Res., 2, 53 (2002).
-
(2002)
Aerosol & Air Quality Res.
, vol.2
, pp. 53
-
-
Bai, H.1
Kang, Y.2
Liu, C.3
-
11
-
-
0029276010
-
-
K. J. Budde, W. J. Holzapfel, and M. M. Beyer, J. Electrochem. Soc., 142, 888 (1995).
-
(1995)
J. Electrochem. Soc.
, vol.142
, pp. 888
-
-
Budde, K.J.1
Holzapfel, W.J.2
Beyer, M.M.3
-
12
-
-
0029541012
-
-
Cambridge, MA, p.
-
M. Tamaoki, K. Nishiki, A. Shimizaki, Y. Sasaki, and S. Yanagi, in Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference, Cambridge, MA, p. 322 (1995).
-
(1995)
Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference
, pp. 322
-
-
Tamaoki, M.1
Nishiki, K.2
Shimizaki, A.3
Sasaki, Y.4
Yanagi, S.5
-
13
-
-
0032063845
-
-
T. Ogata, C. Ban, A. Ueyama, S. Muranaka, T. Hayashi, K. Kobayashi, J. Kobayashi, H. Kurokawa, Y. Ohno, and M. Hirayama, Jpn. J. Appl. Phys., Part 1, 37, 2468 (1998).
-
(1998)
Jpn. J. Appl. Phys., Part 1
, vol.37
, pp. 2468
-
-
Ogata, T.1
Ban, C.2
Ueyama, A.3
Muranaka, S.4
Hayashi, T.5
Kobayashi, K.6
Kobayashi, J.7
Kurokawa, H.8
Ohno, Y.9
Hirayama, M.10
-
14
-
-
30644459182
-
-
N. B. Rana, P. Raghu, and F. Shadman, J. Electrochem. Soc., 145, F35 (2002).
-
(2002)
J. Electrochem. Soc.
, vol.145
, pp. 35
-
-
Rana, N.B.1
Raghu, P.2
Shadman, F.3
-
16
-
-
0037204370
-
-
N. B. Rana, P. Raghu, E. Sharo, and F. Shadman, Appl. Surf. Sci., 205, 160 (2003).
-
(2003)
Appl. Surf. Sci.
, vol.205
, pp. 160
-
-
Rana, N.B.1
Raghu, P.2
Sharo, E.3
Shadman, F.4
-
19
-
-
0000973068
-
-
C. Muller, J. IEST, 42, 19 (1999).
-
(1999)
J. IEST
, vol.42
, pp. 19
-
-
Muller, C.1
-
21
-
-
30644456762
-
-
9402208A-XFR, Sematech
-
S. M. Thornburg, D. C. McIntyre, A. Y. Liang, S. F. Bender, and R. D. Lujan, Technology Transfer Report 9402208A-XFR, Sematech (1994).
-
(1994)
-
-
Thornburg, S.M.1
McIntyre, D.C.2
Liang, A.Y.3
Bender, S.F.4
Lujan, R.D.5
-
22
-
-
0033885339
-
-
P. Aragon, J. Atienza, and M. D. Climent, Crit. Rev. Anal. Chem., 30, 121 (2000).
-
(2000)
Crit. Rev. Anal. Chem.
, vol.30
, pp. 121
-
-
Aragon, P.1
Atienza, J.2
Climent, M.D.3
-
23
-
-
0035416478
-
-
T. Otake, J. Yoshinaga, and Y. Yanagishiwa, Environ. Sci. Technol., 35, 3099 (2001).
-
(2001)
Environ. Sci. Technol.
, vol.35
, pp. 3099
-
-
Otake, T.1
Yoshinaga, J.2
Yanagishiwa, Y.3
-
24
-
-
3342905287
-
-
H. Toda, K. Sako, Y. Yagome, and T. Nakamura, Anal. Chim. Acta, 519, 213 (2004).
-
(2004)
Anal. Chim. Acta
, vol.519
, pp. 213
-
-
Toda, H.1
Sako, K.2
Yagome, Y.3
Nakamura, T.4
-
25
-
-
2342574252
-
-
P. A. Clausen, V. Hansen, L. Gunnarsen, A. Afshari, and P. Wolkoff, Environ. Sci. Technol., 38, 2531 (2004).
-
(2004)
Environ. Sci. Technol.
, vol.38
, pp. 2531
-
-
Clausen, P.A.1
Hansen, V.2
Gunnarsen, L.3
Afshari, A.4
Wolkoff, P.5
-
26
-
-
0028865319
-
-
A. R. Mastrogiacomo, E. Pierini, and L. Sampaolo, Chromatographia, 41, 599 (1995).
-
(1995)
Chromatographia
, vol.41
, pp. 599
-
-
Mastrogiacomo, A.R.1
Pierini, E.2
Sampaolo, L.3
-
27
-
-
15744363932
-
-
Y. Kang, W. Den, H. Bai, and F.-H. Ko, J. Chromatogr. A, 107, 137 (2005).
-
(2005)
J. Chromatogr. A
, vol.107
, pp. 137
-
-
Kang, Y.1
Den, W.2
Bai, H.3
Ko, F.-H.4
-
28
-
-
0023043013
-
-
A. Licciardello, O. Puglisi, and S. Pignataro, Appl. Phys. Lett., 48, 41 (1986).
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 41
-
-
Licciardello, A.1
Puglisi, O.2
Pignataro, S.3
-
29
-
-
21544465957
-
-
T. Takahagi, I. Nagai, A. Ishitani, H. Kuroda, and Y. Nagasawa, J. Appl. Phys., 64, 3516 (1988).
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 3516
-
-
Takahagi, T.1
Nagai, I.2
Ishitani, A.3
Kuroda, H.4
Nagasawa, Y.5
-
30
-
-
30644477915
-
-
G. G. Goodman, P. M. Lindley, and L. A. McCaig, Semicond. Fabtech, 13, 131 (2001).
-
(2001)
Semicond. Fabtech
, vol.13
, pp. 131
-
-
Goodman, G.G.1
Lindley, P.M.2
McCaig, L.A.3
-
32
-
-
30644458425
-
-
ASTM F1982-99, American Society for Testing and Materials; This standard was transferred to SEMI on May 2003, and withdrawn from ASTM standards
-
ASTM F1982-99, American Society for Testing and Materials; This standard was transferred to SEMI on May 2003, and withdrawn from ASTM standards.
-
-
-
-
33
-
-
30644461005
-
-
IEST-RP-CC031, Institute of Environmental Sciences and Technology (2004)
-
IEST-RP-CC031, Institute of Environmental Sciences and Technology (2004).
-
-
-
-
36
-
-
30644479660
-
-
Y. Kang, W. Den, H. Bai, and F.-H. Ko, J. IEST, 48, 21 (2005).
-
(2005)
J. IEST
, vol.48
, pp. 21
-
-
Kang, Y.1
Den, W.2
Bai, H.3
Ko, F.-H.4
-
37
-
-
0035266383
-
-
C. Inoue, N. Mizuno, S. Ogura, Y. Hanayama, S. Hattori, K. Endo, K. Yasutake, M. Morita, and Y. Mori, J. Inst. Environ. Sci. Technol., 44, 23 (2001).
-
(2001)
J. Inst. Environ. Sci. Technol.
, vol.44
, pp. 23
-
-
Inoue, C.1
Mizuno, N.2
Ogura, S.3
Hanayama, Y.4
Hattori, S.5
Endo, K.6
Yasutake, K.7
Morita, M.8
Mori, Y.9
-
38
-
-
0035550944
-
-
K. Takeda, A. Mochizuki, T. Nonaka, I. Matsumoto, T. Fujimoto, and T. Nakahara, J. Inst. Environ. Sci. Technol., 44, 28 (2001).
-
(2001)
J. Inst. Environ. Sci. Technol.
, vol.44
, pp. 28
-
-
Takeda, K.1
Mochizuki, A.2
Nonaka, T.3
Matsumoto, I.4
Fujimoto, T.5
Nakahara, T.6
-
40
-
-
0031640019
-
-
Phoenix, AZ, p.
-
D. Hou, P. Sun, M. Adams, T. Hedges, and S. Govan, in Proceedings of 44th Annual Technical Meeting, Institute of Environmental Sciences and Technology, Phoenix, AZ, p. 419 (1998).
-
(1998)
Proceedings of 44th Annual Technical Meeting, Institute of Environmental Sciences and Technology
, pp. 419
-
-
Hou, D.1
Sun, P.2
Adams, M.3
Hedges, T.4
Govan, S.5
-
41
-
-
0033904338
-
-
Y. Ishihara, D. Nakajima, and T. Ohmi, IEEE Trans. Semicond. Manuf., 13, 16 (2000).
-
(2000)
IEEE Trans. Semicond. Manuf.
, vol.13
, pp. 16
-
-
Ishihara, Y.1
Nakajima, D.2
Ohmi, T.3
-
42
-
-
0031120178
-
-
R. Genco, J. Pitts, and G. Galleger, Semicond. Int., 4, 91 (1997).
-
(1997)
Semicond. Int.
, vol.4
, pp. 91
-
-
Genco, R.1
Pitts, J.2
Galleger, G.3
-
43
-
-
0034313440
-
-
J. Frickinger, J. Bugler, G. Zielonka, L. Pfizner, H. Ryssel, S. Hollemann, and H. Schneider, IEEE Trans. Semicond. Manuf., 13, 427 (2000).
-
(2000)
IEEE Trans. Semicond. Manuf.
, vol.13
, pp. 427
-
-
Frickinger, J.1
Bugler, J.2
Zielonka, G.3
Pfizner, L.4
Ryssel, H.5
Hollemann, S.6
Schneider, H.7
-
44
-
-
0038745325
-
-
M. Veillerot, A. Danel, S. Marthon, and F. Tardif, Solid State Phenom., 92, 105 (2003).
-
(2003)
Solid State Phenom.
, vol.92
, pp. 105
-
-
Veillerot, M.1
Danel, A.2
Marthon, S.3
Tardif, F.4
-
45
-
-
0032116016
-
-
S.-B. Zhu, J. IEST, 41 (4), 30 (1998).
-
(1998)
J. IEST
, vol.41
, Issue.4
, pp. 30
-
-
Zhu, S.-B.1
-
46
-
-
0032157544
-
-
S.-B. Zhu, J. IEST, 41 (5), 36 (1998).
-
(1998)
J. IEST
, vol.41
, Issue.5
, pp. 36
-
-
Zhu, S.-B.1
-
47
-
-
0030196440
-
-
T. Takahagi, S. Shingubara, H. Sakaue, K. Hoshino, and H. Yashima, Jpn. J. Appl. Phys., 35, L818 (1996).
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
, pp. 818
-
-
Takahagi, T.1
Shingubara, S.2
Sakaue, H.3
Hoshino, K.4
Yashima, H.5
-
48
-
-
0034206015
-
-
H. Habuka, M. Shimada, and K. Okuyama, J. Electrochem. Soc., 147, 2319 (2000).
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 2319
-
-
Habuka, H.1
Shimada, M.2
Okuyama, K.3
-
49
-
-
0000790929
-
-
H. Habuka, M. Shimada, and K. Okuyama, J. Electrochem. Soc., 148, G365 (2001).
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. 365
-
-
Habuka, H.1
Shimada, M.2
Okuyama, K.3
-
50
-
-
0013380179
-
-
S. Ishiwari, H. Kato, and H. Habuka, J. Electrochem. Soc., 148, G644 (2001).
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. 644
-
-
Ishiwari, S.1
Kato, H.2
Habuka, H.3
-
52
-
-
0035866014
-
-
Y. Kiso, T. Kon, T. Kitao, and K. Nishimura, J. Membr. Sci., 182, 205 (2001).
-
(2001)
J. Membr. Sci.
, vol.182
, pp. 205
-
-
Kiso, Y.1
Kon, T.2
Kitao, T.3
Nishimura, K.4
-
53
-
-
0037326634
-
-
H. Habuka, S. Ishiwari, H. Kato, M. Shimada, and K. Okuyama, J. Electrochem. Soc., 150, G148 (2003).
-
(2003)
J. Electrochem. Soc.
, vol.150
, pp. 148
-
-
Habuka, H.1
Ishiwari, S.2
Kato, H.3
Shimada, M.4
Okuyama, K.5
-
54
-
-
3142708062
-
-
S. Okamura, M. Shimada, and K. Okuyama, Jpn. J. Appl. Phys., Part 1, 43, 2661 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 1
, vol.43
, pp. 2661
-
-
Okamura, S.1
Shimada, M.2
Okuyama, K.3
-
55
-
-
6344261952
-
-
S. Okamura, M. Shimada, and K. Okuyama, Jpn. J. Appl. Phys., Part 1, 43, 5496 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 1
, vol.43
, pp. 5496
-
-
Okamura, S.1
Shimada, M.2
Okuyama, K.3
-
56
-
-
30644463583
-
-
95052812A-TR, Sematech
-
D. A. Kinhead, Technology Transfer Report 95052812A-TR, Sematech (1995).
-
(1995)
-
-
Kinhead, D.A.1
-
57
-
-
0043013412
-
-
M. Veillerot, A. Danel, S. Cetre, and F. Tardif, Mater. Sci. Eng., B, 102, 385 (2003).
-
(2003)
Mater. Sci. Eng., B
, vol.102
, pp. 385
-
-
Veillerot, M.1
Danel, A.2
Cetre, S.3
Tardif, F.4
-
59
-
-
0037359904
-
-
D. E. Fowler, R. Duque, T. Anoikin, and J. Zhou, IEEE Trans. Semicond. Manuf., 39, 769 (2003).
-
(2003)
IEEE Trans. Semicond. Manuf.
, vol.39
, pp. 769
-
-
Fowler, D.E.1
Duque, R.2
Anoikin, T.3
Zhou, J.4
-
60
-
-
2642558705
-
-
C.-F. Yeh, C.-W. Hsiao, S.-J. Lin, C.-M. Hsieh, T. Kusumi, H. Aomi, H. Kaneko, B.-T. Dai, and M.-S. Tsai, IEEE Trans. Semicond. Manuf., 17, 214 (2004).
-
(2004)
IEEE Trans. Semicond. Manuf.
, vol.17
, pp. 214
-
-
Yeh, C.-F.1
Hsiao, C.-W.2
Lin, S.-J.3
Hsieh, C.-M.4
Kusumi, T.5
Aomi, H.6
Kaneko, H.7
Dai, B.-T.8
Tsai, M.-S.9
-
61
-
-
3142684669
-
-
C.-W. Hsiao, J.-C. Lou, C.-F. Yeh, C.-M. Hsieh, S.-J. Lin, and T. Kusumi, Jpn. J. Appl. Phys., Part 2, 43, L659 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 2
, vol.43
, pp. 659
-
-
Hsiao, C.-W.1
Lou, J.-C.2
Yeh, C.-F.3
Hsieh, C.-M.4
Lin, S.-J.5
Kusumi, T.6
-
62
-
-
0034619287
-
-
K. Horiuchi, J. Shibata, and D. Kouso, J. Appl. Polym. Sci., 78, 1312 (2000).
-
(2000)
J. Appl. Polym. Sci.
, vol.78
, pp. 1312
-
-
Horiuchi, K.1
Shibata, J.2
Kouso, D.3
-
63
-
-
0035649489
-
-
S. Shiratori, T. Suzuki, S. Kushida, and Y. Inami, Sens. Mater., 13, 77 (2001).
-
(2001)
Sens. Mater.
, vol.13
, pp. 77
-
-
Shiratori, S.1
Suzuki, T.2
Kushida, S.3
Inami, Y.4
-
64
-
-
0035421679
-
-
S. Shiratori, Y. Inami, and M. Kikuchi, Thin Solid Films, 303, 243 (2001).
-
(2001)
Thin Solid Films
, vol.303
, pp. 243
-
-
Shiratori, S.1
Inami, Y.2
Kikuchi, M.3
-
66
-
-
30644467328
-
-
Nippon Muki Co., Ltd., Personal communication
-
Nippon Muki Co., Ltd., Personal communication.
-
-
-
-
68
-
-
30644468941
-
-
Ph.D. Dissertation, National Chiao-Tung University, Hsinchu, Taiwan
-
Y. Kang, Ph.D. Dissertation, National Chiao-Tung University, Hsinchu, Taiwan (2005).
-
(2005)
-
-
Kang, Y.1
-
69
-
-
30644475446
-
-
Tokyo, Japan, p.
-
R. Sasajima, E. Takami, N. Nakamura, and H. Miya, in Proceedings of the 19th Annual Technical Meeting on Air Cleaning and Contamination Control, Tokyo, Japan, p. 10 (2002) [in Japanese].
-
(2002)
Proceedings of the 19th Annual Technical Meeting on Air Cleaning and Contamination Control
, pp. 10
-
-
Sasajima, R.1
Takami, E.2
Nakamura, N.3
Miya, H.4
-
70
-
-
0031631167
-
-
Phoenix, AZ, p.
-
K. Takeda, T. Nonaka, Y. Sakamoto, T. Taira, K. Hirono, T. Fujimoto, N. Suwa, and K. Otsuka, in Proceedings of the Institute of Environmental Sciences and Technology, Phoenix, AZ, p. 556 (1998).
-
(1998)
Proceedings of the Institute of Environmental Sciences and Technology
, pp. 556
-
-
Takeda, K.1
Nonaka, T.2
Sakamoto, Y.3
Taira, T.4
Hirono, K.5
Fujimoto, T.6
Suwa, N.7
Otsuka, K.8
-
71
-
-
30644463791
-
-
Tokyo, Japan, p.
-
Y. Sakamoto, K. Takeda, T. Taira, T. Nonaka, K. Hirono, T. Fujimoto, N. Suwa, and K. Otsuka, in Proceedings of the 16th Annual Technical Meeting on Air Cleaning and Contamination Control, Tokyo, Japan, p. 215 (1998) [in Japanese].
-
(1998)
Proceedings of the 16th Annual Technical Meeting on Air Cleaning and Contamination Control
, pp. 215
-
-
Sakamoto, Y.1
Takeda, K.2
Taira, T.3
Nonaka, T.4
Hirono, K.5
Fujimoto, T.6
Suwa, N.7
Otsuka, K.8
-
72
-
-
30644462818
-
-
Tokyo, Japan, p.
-
H. Takahashi, K. Sato, S. Sakata, and T. Okada, in Proceedings of the 16th Annual Technical Meeting on Air Cleaning and Contamination Control, Tokyo, Japan, p. 231 (1998) [in Japanese].
-
(1998)
Proceedings of the 16th Annual Technical Meeting on Air Cleaning and Contamination Control
, pp. 231
-
-
Takahashi, H.1
Sato, K.2
Sakata, S.3
Okada, T.4
-
73
-
-
30644480530
-
-
Tokyo, Japan, p.
-
T. Takatsuka, M. Tomonari, M. Godo, K. Miura, H. Sata, K. Yajima, S. Takami, M. Kubo, and A. Miyamoto, in Proceedings of the 19th Annual Technical Meeting on Air Cleaning and Contamination Control, Tokyo, Japan, p. 5 (2001) [in Japanese].
-
(2001)
Proceedings of the 19th Annual Technical Meeting on Air Cleaning and Contamination Control
, pp. 5
-
-
Takatsuka, T.1
Tomonari, M.2
Godo, M.3
Miura, K.4
Sata, H.5
Yajima, K.6
Takami, S.7
Kubo, M.8
Miyamoto, A.9
|