Restoring atomic configuration at interfaces by image deconvolution

Journal of Electron Microscopy

Volumn 54, Issue 5, 2005, Pages 445-453

  Tang, Chun Yan ^a   Li, Fang Hua ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

Dynamical scattering effect; Elliptical windows; High resolution transmission electron microscopy; Image deconvolution; Interfaces

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; IMAGE RECONSTRUCTION;

ATOMIC CONFIGURATION; DECONVOLUTION TECHNIQUES; DYNAMICAL SCATTERING; DYNAMICAL SCATTERING EFFECT; EFFECT CORRECTIONS; ELLIPTICAL WINDOWS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE DECONVOLUTION; INTERFACE STUDIES; SCATTERING EFFECTS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 29444446406     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfh107     Document Type: Article

References (46)

1. Phillips R (2001) Crystals, Defects and Microstructures: Modeling across Scales. (Cambridge University Press, Cambridge.)
2. Lin T H (1982) Fatigue crack initiation with creep. In: Defects and Fracture, eds Sih G C and Zorski H, pp. 3-13, (Martinus Nijhoff, the Hague).
3. Molodov D A (2001) Grain boundary character - a key factor for grain boundary control. In: Recrystallization and Grain Growth: Vol. I, eds Gottstein G and Molodov D A, pp. 21-38, (Springer-Verlag, Berlin).
4. Ichinose H and Ishida Y (1981) Observation of [110] tilt boundary structure in gold by high resolution HVEM. Phil. Mag. A 43: 1253-1264.
5. Sawada H, Ichinose H, and Kohyama M (2002) Imaging of a single atomic column in silicon grain boundary. J. Electron Microsc. 51: 353-357.
6. Iijima S (1971) High-resolution of electron microscopy of crystal lattice of titanium-niobium oxide. J. Appl. Phys. 42: 5891-5893.
7. Uyeda N, Kobayashi T, Suito E, Harada Y, and Watanabe M (1972) Molecular image resolution in electron microscopy. J. Appl. Phys. 43: 5181-5189.
8. Cowley J M and Iijima S (1972) Electron microscope image contrast for thin crystals. Z. Naturforsch. A 27: 445-451.
9. Scherzer O (1949) The theoretical resolution limit of electron microscope. J. Appl. Phys. 20: 20-29.
10. Phillipp F, Höschen R, Osaki M, Möbus G, and Rühle M (1994) New high-voltage atomic resolution microscope approaching 1 Å point resolution installed in Stuttgart. Ultramicroscopy 56: 1-3.
11. Möbus G, Phillipp F, Gemming T, Schweinfest R, and Rühle M (1997) Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope. J. Electron Microsc. 46: 381-395.
12. Takuma E, Ichinose H, and Chen F R (2002) Atomic structure observation of silicon carbide using HRTEM. J. Electron Microsc. 51: 297-302.
13. Ichinose H (2000) Development and tuning of atomic resolution HVEM. In: Proceedings of the International Kunming Symposium on Microscopy, eds Li F H, Liu H P, and Peng L-M, pp. 11-12, July 2-5, 2000, Kunming (published by CEMS, Beijing).
14. Haider M, Uhlemann S, Schwan E, Rose H, Kabius B, and Urban K (1998) Electron microscopy image enhanced. Nature 392: 768-769.
15. Lentzen M, Jahnen B, Jia C L, Thust A, Tillmann K, and Urban K (2002) High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy 92: 233-242.
16. Jia C L, Lentzen M, and Urban K (2003) Atomic-resolution imaging of oxygen in perovskite ceramics. Science 299: 870-873.
17. James E M and Browning N D (1999) Practical aspects of atomic resolution imaging and analysis in STEM. Ultramicroscopy 78: 125-139.
18. Nellist P D and Pennycook S J (1998) Subangstrom resolution by underfocused incoherent transmission electron microscopy. Phys. Rev. Lett. 81: 4156-4159.
19. Schiske P (1968) Zur Frage der Bildrekonstruktion durch Fokusreihen. In: Proceedings of the 4th European Conference on Electron Microscopy, Rome, pp. 145-146.
20. Van Dyck D, Lichte H, and Van der Mast K D (1996) Sub-ångström structure characterisation: the Brite-Euram route towards one ångström. Ultramicroscopy 64: 1-15.
21. Li F H and Fan H F (1979) Image deconvolution in high resolution electron microscopy by making use of Sayre equation. Acta Phys. Sinica 28: 267-278.
22. He W Z, Li F H, Chen H, Kawasaki K, and Oikawa T (1997) Image deconvolution for defected crystals in field-emission high-resolution electron microscopy. Ultramicroscopy 70: 1-11.
23. Coene W, Janssen G, Op de Beeck M, and Van Dyck D (1992) Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy. Phys. Rev. Lett. 69: 3743-3746.
24. Lichte H (1992) Electron holography: I. Can electron holography reach 0.1 nm resolution? Ultramicroscopy 47: 223-230.
25. Coene W M J, Thust A, Op de Beeck M, and Van Dyck D (1996) Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 64: 109-135.
26. Op de Beeck M, Van Dyck D, and Coene W (1996) Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy 64: 167-183.
27. Op de Beeck M and Van Dyck D (1996) Direct structure reconstruction in HRTEM. Ultramicroscopy 64: 153-165.
28. Tang D, Zandbergen H W, Jansen J, Op de Beeck M, and van Dyck D (1996) Fine-tuning of the focal residue in exit-wave reconstruction. Ultramicroscopy 64: 265-276.
29. Van Dyck D and Op de Beeck M (1996) A simple intuitive theory for electron diffraction. Ultramicroscopy 64: 99-107.
30. Zandbergen H W, Tang D, Jansen J, and Cava R J (1996) The use of through focus exit wave reconstruction in the structure determination of several intermetallic superconductors. Ultramicroscopy 64: 231-247.
31. Orchowski A and Lichte H (1996) High-resolution electron holography of non-periodic structures at the example of a = 13 grain boundary in gold. Ultramicroscopy 64: 199-209.
32. Li F H and Tang D (1985) Pseudo-weak-phase-object approximation in high-resolution electron microscopy. Acta Cryst. A 41: 376-382.
33. Tang D and Li F H (1988) A method of image restoration for pseudo-weak phase objects. Ultramicroscopy 25: 61-68.
34. Han F S, Fan H F, and Li F H (1986) Image processing in high-resolution electron microscopy using the direct method. II. Image deconvolution. Acta Cryst. A 42: 353-356.
35. Yang S X and Li F H (2000) Image deconvolution for protein crystals. Ultramicroscopy 85: 51-59.
36. Fan H F, Zhong Z Y, Zheng C D, and Li F H (1985) Image processing in high-resolution electron microscopy using the direct method. I. Phase extension. Acta Cryst. A 41: 163-165.
37. Hu J J and Li F H (1991) Maximum entropy image deconvolution in high resolution electron microscopy. Ultramicroscopy 35: 339-350.
38. Li F H (1998) Image processing based on the combination of high-resolution electron microscopy and electron diffraction. Microsc. Res. Techniq. 40: 86-100.
39. Li F H (2003) Effect of diffraction crystallography on HREM. Z. Kristallogr. 218: 279-292.
40. Li F H, Wang D, He W Z, and Jiang H (2000) Amplitude correction in image deconvolution for determining crystal defects at atomic level. J. Electron Microsc. 49: 17-24.
41. Wang D, Li F H, and Zou J (2000) Distinguishing glide and shuffle types for 60° dislocation in semiconductors by field-emission HREM image processing. Ultramicroscopy 85: 131-139.
42. 0.24/ Si. Ultramicroscopy 93: 139-146.
43. Wang D, Zou J, He W Z, Chen H, Li F H, Kawasaki K, and Oikawa T (2004) Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM. Ultramicroscopy 98: 259-264.
44. Thon F (1971) Phase contrast electron microscopy. In: Electron Microscopy in Materials Science, ed. Valdre U, pp. 570-625, (Academic Press, New York).
45. Thust A, Coene W M J, Op de Beeck M, and van Dyck D (1996) Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy 64: 211-230.
46. Lichte H (1991) Optimum focus for taking electron holograms. Ultramicroscopy 38: 13-22.