Image processing based on the combination of high-resolution electron microscopy and electron diffraction

Microscopy Research and Technique

Volumn 40, Issue 2, 1998, Pages 86-100

  Li, F H ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

Crystal structure determination; Image deconvolution; Phase extension

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; IMAGE RESOLUTION;

CONDITION; CRYSTAL STRUCTURE DETERMINATION; DEFOCUS; DIFFRACTION INTENSITY; IMAGE CONTRASTS; IMAGE DECONVOLUTION; IMAGES PROCESSING; PHASE EXTENSION; RESOLUTION ENHANCEMENT; WEAK PHASE OBJECT;

ELECTRONS;

ARTICLE; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE RECONSTRUCTION; PRIORITY JOURNAL; STRUCTURE ANALYSIS;

EID: 0032518419     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980115)40:2<86::AID-JEMT2>3.0.CO;2-R     Document Type: Article

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