Effect of diffraction crystallography on HREM

Zeitschrift fur Kristallographie

Volumn 218, Issue 4, 2003, Pages 279-292

  Li, F H ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; LANTHANUM; STRONTIUM;

ARTICLE; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; KINEMATICS; STRUCTURE ANALYSIS; TECHNIQUE; THICKNESS;

EID: 0041808814     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.218.4.279.20746     Document Type: Article

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