Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope

Journal of Electron Microscopy

Volumn 46, Issue 5, 1997, Pages 381-395

  Mobus G ^a   Phillipp, F ^a   Gemming, T ^a   Schweinfest, R ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

High voltage atomic resolution microscope; Quantitative diffractometry

Indexed keywords

CCD CAMERAS; DIFFRACTION; IMAGE PROCESSING; MICROSCOPES; OPTICAL DATA PROCESSING;

ATOMIC-RESOLUTION; CONTRAST TRANSFER; DIFFRACTOMETRY; HIGH-VOLTAGE ATOMIC RESOLUTION MICROSCOPE; HIGH-VOLTAGES; NM RESOLUTION; OPTICAL PARAMETER; QUANTITATIVE DIFFRACTOMETRY; RECORDING MEDIA; THIN FOIL;

ATOMS;

EID: 0030710612     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023534     Document Type: Article

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