High frequency noise of SOI MOSFETs: Performances and limitations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5844, Issue , 2005, Pages 185-199

  Danneville, François ^a   Pailloncy, Guillaume ^a   Siligaris, Alexandre ^a   Iñiguez, Benjamin ^b   Dambrine, Gilles ^a  

^a Institut d'Electronique   (France)

^b UNIVERSITAT ROVIRA I VIRGILI   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRIC CURRENTS; MOSFET DEVICES;

HIGH FREQUENCY NOISE; TUNNELING GATE CURRENTS;

SPURIOUS SIGNAL NOISE;

EID: 28444496697     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.609669     Document Type: Conference Paper

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