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Volumn 5470, Issue , 2004, Pages 131-140
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Noise investigations of 90 nm VLSI CMOS technologies for analog integrated circuits at millimeter wave frequencies
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Author keywords
CMOS; Integrated circuits; Millimeter wave frequencies; Noise; SOI
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Indexed keywords
LOW NOISE AMPLIFIERS (LNA);
MILLIMETER WAVE FREQUENCIES;
SOI;
AMPLIFIERS (ELECTRONIC);
GAIN MEASUREMENT;
GATES (TRANSISTOR);
MILLIMETER WAVE DEVICES;
MONOLITHIC INTEGRATED CIRCUITS;
OPTIMIZATION;
SILICON ON INSULATOR TECHNOLOGY;
SPURIOUS SIGNAL NOISE;
VLSI CIRCUITS;
CMOS INTEGRATED CIRCUITS;
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EID: 4344651640
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.546373 Document Type: Conference Paper |
Times cited : (3)
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References (7)
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