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Volumn 96, Issue 10, 2004, Pages 5921-5923

Fabrication of conducting Si nanowire arrays

Author keywords

[No Author keywords available]

Indexed keywords

GATE LENGTHS; NANOSCALE MOSAICS; ULTRADENSE FIELD-EFFECT TRANSISTOR ARRAYS;

EID: 9944261461     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1801155     Document Type: Article
Times cited : (81)

References (19)
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    • (2000) Appl. Phys. Lett. , vol.76 , pp. 2068
    • Chung, S.1    Yu, J.2    Heath, J.3
  • 5
    • 9944262845 scopus 로고    scopus 로고
    • note
    • The Pt is deposited using an electron-beam evaporator and a self-aligned shadow mask technique. For the wires shown in Fig. 1, 8 nm of Pt was deposited at an evaporation angle of 15° above the plane of the sample.
  • 6
    • 9944251315 scopus 로고    scopus 로고
    • Ibis Technology Corporation, Danvers, MA
    • Ibis Technology Corporation, Danvers, MA.
  • 7
    • 9944237740 scopus 로고    scopus 로고
    • note
    • For the 4 in. SOI substrates, 75 nm of plasma enhanced chemical-vapor deposition grown oxide is deposited. This is followed by a selective etch to open windows above the nanowire sections.
  • 8
    • 0003699181 scopus 로고    scopus 로고
    • Lattice, Sunset Beach, California
    • 2 at 20 sccm (denotes cubic centimeter per minute at STP) /30 sccm/2.5 sccm respectively, and an overall pressure of 5 mT. The rf power was 40 W and the etch time was determined using an end-point detector (interferometer). S. Wolf and R. N. Tauber, Silicon processing for the VLSI era (Lattice, Sunset Beach, California, 2000); Handbook of advanced plasma processing techniques, edited by R. J. Shul and S. J. Pearton (Springer, Berlin, 2000).
    • (2000) Silicon Processing for the VLSI Era
    • Wolf, S.1    Tauber, R.N.2
  • 9
    • 0003747961 scopus 로고    scopus 로고
    • Springer, Berlin
    • 2 at 20 sccm (denotes cubic centimeter per minute at STP) /30 sccm/2.5 sccm respectively, and an overall pressure of 5 mT. The rf power was 40 W and the etch time was determined using an end-point detector (interferometer). S. Wolf and R. N. Tauber, Silicon processing for the VLSI era (Lattice, Sunset Beach, California, 2000); Handbook of advanced plasma processing techniques, edited by R. J. Shul and S. J. Pearton (Springer, Berlin, 2000).
    • (2000) Handbook of Advanced Plasma Processing Techniques
    • Shul, R.J.1    Pearton, S.J.2
  • 10
    • 9944238221 scopus 로고    scopus 로고
    • note
    • This value is calculated using the dimensions of the nanowires as measured via the SEM and using the resistivity measured for the bulk substrate, assuming 3 NWs are contacted for each electrode. Fluctuations due to the varying numbers of wires contacted are not significant on the scale of the variation between the substrates.
  • 11
    • 9944263353 scopus 로고    scopus 로고
    • Emulsitone Company, Whippany, New Jersey
    • Emulsitone Company, Whippany, New Jersey.
  • 12
    • 9944221412 scopus 로고    scopus 로고
    • note
    • The look-up table was generated by measuring the four-point resistivity of a series of doped samples annealed at various temperatures and times. The temperatures ranged from 800 to 1000°C and the times from 1 to 8 min.
  • 13
    • 9944239701 scopus 로고    scopus 로고
    • note
    • Resistance values were measured for wires from 2.5 to 22.5 μm in length.
  • 17
    • 0000063661 scopus 로고    scopus 로고
    • T. Ono, H. Saitoh, and M. Esashi, Appl. Phys. Lett. 70, 1852 (1997); A. Tao, F. Kim, C. Hess, J. Goldberger, R. He, Y. Sun, Y. Xia, and P. Yang, Nano Lett. 3, 1229 (2003); Y. Yin, B. Gates, and Y. Xia, Adv. Mater. (Weinheim, Ger.) 12, 1426 (2000).
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1852
    • Ono, T.1    Saitoh, H.2    Esashi, M.3
  • 18
  • 19
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    • Weinheim, Ger.
    • T. Ono, H. Saitoh, and M. Esashi, Appl. Phys. Lett. 70, 1852 (1997); A. Tao, F. Kim, C. Hess, J. Goldberger, R. He, Y. Sun, Y. Xia, and P. Yang, Nano Lett. 3, 1229 (2003); Y. Yin, B. Gates, and Y. Xia, Adv. Mater. (Weinheim, Ger.) 12, 1426 (2000).
    • (2000) Adv. Mater. , vol.12 , pp. 1426
    • Yin, Y.1    Gates, B.2    Xia, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.